BONERA, EMILIANO
 Distribuzione geografica
Continente #
NA - Nord America 8.808
EU - Europa 3.565
AS - Asia 928
Continente sconosciuto - Info sul continente non disponibili 9
AF - Africa 7
SA - Sud America 5
OC - Oceania 3
Totale 13.325
Nazione #
US - Stati Uniti d'America 8.673
DE - Germania 1.146
IT - Italia 611
CN - Cina 511
SE - Svezia 507
UA - Ucraina 356
GB - Regno Unito 259
VN - Vietnam 152
CA - Canada 135
FI - Finlandia 122
AT - Austria 112
BE - Belgio 107
IE - Irlanda 99
IN - India 90
HK - Hong Kong 85
RU - Federazione Russa 55
DK - Danimarca 52
FR - Francia 47
NL - Olanda 44
TR - Turchia 30
CH - Svizzera 22
JP - Giappone 12
PK - Pakistan 10
EU - Europa 9
KR - Corea 9
IR - Iran 8
SG - Singapore 8
TW - Taiwan 7
CZ - Repubblica Ceca 6
GR - Grecia 6
ES - Italia 5
CI - Costa d'Avorio 4
BR - Brasile 3
RO - Romania 3
NZ - Nuova Zelanda 2
TN - Tunisia 2
AU - Australia 1
BG - Bulgaria 1
BN - Brunei Darussalam 1
BY - Bielorussia 1
CL - Cile 1
HU - Ungheria 1
ID - Indonesia 1
IL - Israele 1
ME - Montenegro 1
MK - Macedonia 1
MY - Malesia 1
PH - Filippine 1
PY - Paraguay 1
RS - Serbia 1
SA - Arabia Saudita 1
SC - Seychelles 1
Totale 13.325
Città #
Ann Arbor 2.711
Woodbridge 1.007
Frankfurt am Main 871
Fairfield 733
Chandler 600
Houston 493
Jacksonville 426
Wilmington 386
Ashburn 369
Seattle 255
Cambridge 254
Dearborn 227
Princeton 191
Milan 166
Nanjing 134
New York 119
Vienna 106
Brussels 99
Dublin 98
Dong Ket 92
Hong Kong 84
Lawrence 76
Altamura 73
Lachine 71
Beijing 67
Toronto 51
Helsinki 48
San Diego 46
Southend 44
Nanchang 43
Andover 37
Shenyang 32
Grafing 29
Guangzhou 29
London 26
Rome 26
Boardman 25
Huizen 25
Hebei 23
Jinan 23
Pune 23
Jiaxing 22
Philadelphia 22
Ardea 20
Norwalk 20
Falls Church 17
Tianjin 16
Florence 14
Fremont 14
Hangzhou 14
Sacramento 14
Shanghai 14
Frankfurt An Der Oder 13
Los Angeles 13
Taizhou 13
Zurich 13
Arcore 12
Changsha 11
Kunming 11
Mountain View 11
Brescia 10
Colle 10
Redmond 9
Zhengzhou 9
Edmonton 8
Elk Grove Village 8
Hefei 8
Nürnberg 8
Serra 8
Leawood 7
Pisa 7
Southampton 7
Auburn Hills 6
Detroit 6
Duncan 6
Eindhoven 6
Hanoi 6
Lanzhou 6
Taipei 6
Dresden 5
Hounslow 5
Leuven 5
Ottawa 5
Pavia 5
Abidjan 4
Amsterdam 4
Caserta 4
Chemnitz 4
Chicago 4
Daejeon 4
Islamabad 4
Lahore 4
Marburg 4
Ningbo 4
Oakland 4
Phoenix 4
San Mateo 4
University Park 4
Washington 4
Augusta 3
Totale 10.751
Nome #
High–temperature droplet epitaxy of symmetric GaAs/AlGaAs quantum dots 343
Disassembling Silicene from Native Substrate and Transferring onto an Arbitrary Target Substrate 304
Thickness determination of anisotropic van der Waals crystals by Raman spectroscopy: the case of black phosphorus 303
Broadband control of the optical properties of semiconductors through site-controlled self-assembly of microcrystals 302
Stability and universal encapsulation of epitaxial Xenes 287
Ambient atmosphere laser-induced local ripening of MoS2 nanoparticles 255
Droplet Controlled Growth Dynamics in Molecular Beam Epitaxy of Nitride Semiconductors 244
Optical properties of micron-sized crystals grown via 3D heteroepitaxy 220
High-Yield Fabrication of Entangled Photon Emitters for Hybrid Quantum Networking Using High-Temperature Droplet Epitaxy 218
Spectral broadening in self-assembled GaAs quantum dots with narrow size distribution 217
Solid-state dewetting dynamics of amorphous ge thin films on silicon dioxide substrates 197
Straining Ge bulk and nanomembranes for optoelectronic applications: a systematic numerical analysis 196
Dislocation distribution across ultrathin silicon-on-insulator with epitaxial SiGe stressor 194
Spin-dependent direct gap emission in tensile-strained Ge films on Si substrates 189
Exceptional thermal strain reduction by a tilting pillar architecture: Suspended Ge layers on Si (001) 188
Spin-dependent direct gap emission in tensile-strained Ge films on Si substrates 181
Monitoring the kinetic evolution of self-assembled SiGe islands grown by Ge surface thermal diffusion from a local source 180
A Structural Characterization of GaAs MBE Grown on Si Pillars 179
Growth Suppression by Metal Droplets of In0.5Ga0.5N/Si(111) at Low Temperatures 177
Raman spectroscopy for the analysis of temperature-dependent plastic relaxation of SiGe layers 176
Epitaxial self-assembly of 3-D semiconductor structures on deeply patterned Si substrates at the microscale 175
Photoluminescence study of interband transitions in few-layer, pseudomorphic, and strain-unbalanced Ge/GeSi multiple quantum wells 174
Ordered Arrays of SiGe Islands from Low-Energy PECVD 173
Modelling of the phonon strain shift coefficients in Si 1-x Ge x alloys 173
High-Yield Fabrication of Entangled Photon Emitters for Hybrid Quantum Networking Using High-Temperature Droplet Epitaxy 173
Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures 172
Homogeneity of Ge-rich nanostructures as characterized by chemical etching and transmission electron microscopy 171
Strain in a single ultrathin silicon layer on top of SiGe islands: Raman spectroscopy and simulations 169
Local uniaxial tensile strain in germanium of up to 4% induced by SiGe epitaxial nanostructures 169
Integration of MOSFETs with SiGe dots as stressor material 163
Strain Engineering in Highly Mismatched SiGe/Si Heterostructures 162
Raman spectroscopy of epitaxial InGaN/Si in the central composition range 160
Embedding epitaxial (blue) phosphorene in between device-compatible functional layers 160
Delayed plastic relaxation limit in SiGe islands grown by Ge diffusion from a local source 156
InAs/GaAs Sharply Defined Axial Heterostructures in Self-Assisted Nanowires 155
Spin-dependent direct gap emission in tensile-strained Ge films on Si substrates 155
Tensile strain in Ge membranes induced by SiGe nanostressors 149
Insights into the C distribution in Si:C/Si:C:P and the annealing behavior of Si:C layers 148
Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides 146
SiGe nano-stressors for Ge strain-engineering 146
Phonon strain shift coefficients in SixGe1-x alloys 145
Disentangling nonradiative recombination processes in Ge micro-crystals on Si substrates 143
Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy 139
Monolithic integration of optical grade GaAs on Si (001) substrates deeply patterned at a micron scale 138
Excitonic fine structure in GaAs/AlGaAs (111) quantum dots grown by droplet epitaxy 138
Micro and nanofabrication of SiGe/Ge bridges and membranes by wet-anisotropic etching 137
An exceptional thermal strain reduction in Ge suspended layer grown on Si by a tilting pillar architecture 133
Raman efficiency in SiGe alloys 131
Three dimensional heteroepitaxy: A new path for monolithically integrating mismatched materials with silicon 131
Local Uniaxial Tensile Deformation of Germanium up to the 4% Threshold by Epitaxial Nanostructures. 127
SiGe nanostructures inducing tensile strain in suspended germanium membranes. 125
EPR and UV-Raman study of BPSG thin films: structure and defects 124
Crystal defects and junction properties in the evolution of device fabrication technology 123
Lithographically defined low dimensional SiGe nanostripes as silicon stressors 122
Substrate strain manipulation by nanostructure perimeter forces 120
Strain release management in SiGe/Si films by substrate patterning 120
Band alignment at the La2Hf2O7/(001)Si interface 119
Determination of Raman Efficiency in SiGe Alloys 117
Anisotropic extended misfit dislocations in overcritical SiGe films by local substrate patterning 114
Optothermal Raman Spectroscopy of Black Phosphorus on a Gold Substrate 113
Spin-dependent direct gap emission in tensile-strained Ge-on-Si heterostructures 112
Strain in Si or Ge from the Edge Forces of Epitaxial Nanostructures 112
Addressing spin-optoelectronic properties of Ge by polarization and time-resolved PL investigations 111
Ge-rich islands grown on patterned Si substrates by low-energy plasma-enhanced chemical vapour deposition 109
Elastic and Plastic Stress Relaxation in Highly Mismatched SiGe/Si Crystals 107
Raman spectroscopy for a micrometric and tensorial analysis of stress in silicon 106
Near-field optical imaging of electromigration damages in passivated metal stripes 105
How Oxygen Absorption Affects the Al2O3-Encapsulated Blue Phosphorene–Au Alloy 105
Raman spectroscopy determination of composition and strain in Si1-xGex/Si heterostructures 104
Dielectric properties of high-kappa oxides: Theory and experiment for Lu-2O-3 104
Probing the Laser Ablation of Black Phosphorus by Raman Spectroscopy 103
Conductive n-type gallium nitride thin films prepared by sputter deposition 102
Optical Orientation of Spins in Bulk Ge studied by Direct-Gap Photoluminescence 101
Atomic layer deposition of Lu silicate films using {[(Me3Si)(2)N](3)Lu} 100
Renishaw Application Note : Imaging of silicon stress in microelectronics using Raman spectroscopy 99
Structure evolution of atomic layer deposition grown ZrO2 films by deep-ultra-violet Raman and far-infrared spectroscopies 98
Monolithic integration of GaAs on deeply patterned Si substrates by self-assembled arrays of three-dimensional microcrystals 97
Development of a combined confocal and scanning near-field Raman microscope for deep UV laser excitation 96
Phosphorous-oxygen hole centers in phosphosilicate glass films 94
Local uniaxial tensile deformation of germanium up to the 4% threshold by epitaxial nanostructures 94
Raman stress maps from finite-element models of silicon structures 91
Combining high resolution and tensorial analysis in Raman stress measurements of silicon 91
Effects of annealing temperature and surface preparation on the formation of cobalt silicide interconnects 89
Time of flight secondary ion mass spectrometry study of silicon nanoclusters embedded in thin silicon oxide layers 88
Atomic-layer deposition of Lu2O3 85
Crystal and molecular structure of [(eta(5)-C5H4SiMe3)(2)LuCl](2): A precursor for the production of Lu2O3 films 84
A novel 0.16 um 300 V SOIBCD for ultrasound medical applications 82
Energy-band diagram of metal/Lu2O3/silicon structures 79
Defect Generation in Device Processing and Impact on the Electrical Performances 79
Optical and thermal responses of silicene in Xene heterostructures 77
Resonant Raman microscopy of stress in silicon-based microelectronics 77
Stress mapping in silicon: Advantages of using a Raman spectrometer with a single dispersive stage 77
A full self-consistent methodology for strain-induced effects characterization in silicon devices 74
Defect generation and suppression in device processes using a shallow trench isolation scheme 72
The role of high temperature treatments in stress release and defect reduction 64
Bendable Silicene Membranes 58
Vapour Liquid Solid Growth Effects on InGaN Epilayers Composition Uniformity in Presence of Metal Droplets 54
Group IV membranes 38
Emerging Two-Dimensional Materials: Inspiring Nanotechnologies for Smart Energy Management 21
Totale 13.797
Categoria #
all - tutte 30.984
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 30.984


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/20191.013 0 0 0 0 0 150 88 56 70 146 230 273
2019/20202.346 295 114 152 172 204 251 355 184 255 156 150 58
2020/20212.543 113 84 221 323 157 221 216 241 216 267 172 312
2021/20221.741 143 180 192 110 86 189 127 86 80 146 132 270
2022/20232.828 322 766 326 260 146 356 55 146 195 48 151 57
2023/2024684 75 74 99 56 212 168 0 0 0 0 0 0
Totale 13.797