Silicon-rich SiGe alloys represent a promising platform for the development of large-area single-mode optical waveguides to be integrated in silicon-based optical circuits. We find that SiGe layers epitaxially grown on Si successfully guide radiation with a 1.55 μm wavelength, but, beyond a critical core thickness, their optical properties are strongly affected by the clustering of misfit dislocations at the interface between Si and SiGe, leading to a significant perturbation of the local refractive index. Transmission electron microscopy and micro-Raman spectroscopy, together with finite-element simulations, provide a complete analysis of the impact of dislocations on optical propagation. © 2009 Elsevier B.V. All rights reserved.

Trita, A., Bragheri, F., Cristiani, I., Degiorgio, V., Chrastina, D., Colombo, D., et al. (2009). Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides. OPTICS COMMUNICATIONS, 282(24), 4716-4722 [10.1016/j.optcom.2009.09.026].

Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides

BONERA, EMILIANO;PEZZOLI, FABIO;GRILLI, EMANUELE ENRICO;GUZZI, MARIO;MIGLIO, LEONIDA
2009

Abstract

Silicon-rich SiGe alloys represent a promising platform for the development of large-area single-mode optical waveguides to be integrated in silicon-based optical circuits. We find that SiGe layers epitaxially grown on Si successfully guide radiation with a 1.55 μm wavelength, but, beyond a critical core thickness, their optical properties are strongly affected by the clustering of misfit dislocations at the interface between Si and SiGe, leading to a significant perturbation of the local refractive index. Transmission electron microscopy and micro-Raman spectroscopy, together with finite-element simulations, provide a complete analysis of the impact of dislocations on optical propagation. © 2009 Elsevier B.V. All rights reserved.
Articolo in rivista - Articolo scientifico
semiconductors, spectroscopy
English
Trita, A., Bragheri, F., Cristiani, I., Degiorgio, V., Chrastina, D., Colombo, D., et al. (2009). Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides. OPTICS COMMUNICATIONS, 282(24), 4716-4722 [10.1016/j.optcom.2009.09.026].
Trita, A; Bragheri, F; Cristiani, I; Degiorgio, V; Chrastina, D; Colombo, D; Isella, G; von Känel, H; Gramm, F; Müller, E; Döbeli, M; Bonera, E; Gatti, R; Pezzoli, F; Grilli, E; Guzzi, M; Miglio, L
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/10281/8158
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