Silicon-rich SiGe alloys represent a promising platform for the development of large-area single-mode optical waveguides to be integrated in silicon-based optical circuits. We find that SiGe layers epitaxially grown on Si successfully guide radiation with a 1.55 μm wavelength, but, beyond a critical core thickness, their optical properties are strongly affected by the clustering of misfit dislocations at the interface between Si and SiGe, leading to a significant perturbation of the local refractive index. Transmission electron microscopy and micro-Raman spectroscopy, together with finite-element simulations, provide a complete analysis of the impact of dislocations on optical propagation. © 2009 Elsevier B.V. All rights reserved.
Trita, A., Cristiani, I., Degiorgio, V., Chrastina, D., Colombo, D., Isella, G., et al. (2009). Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides. OPTICS COMMUNICATIONS, 282(24), 4716-4722 [10.1016/j.optcom.2009.09.026].
Citazione: | Trita, A., Cristiani, I., Degiorgio, V., Chrastina, D., Colombo, D., Isella, G., et al. (2009). Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides. OPTICS COMMUNICATIONS, 282(24), 4716-4722 [10.1016/j.optcom.2009.09.026]. | |
Tipo: | Articolo in rivista - Articolo scientifico | |
Titolo: | Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides | |
Autori: | Trita, A, Bragheri, F; Cristiani, I; Degiorgio, V; Chrastina, D; Colombo, D; Isella, G; von Känel, H; Gramm, F; Müller, E; Döbeli, M; Bonera, E; Gatti, R; Pezzoli, F; Grilli, EE; Guzzi, M; Miglio, L; | |
Autori: | ||
Data di pubblicazione: | 2009 | |
Lingua: | English | |
Rivista: | OPTICS COMMUNICATIONS | |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1016/j.optcom.2009.09.026 | |
Appare nelle tipologie: | 01 - Articolo su rivista |