PEZZOLI, FABIO
PEZZOLI, FABIO
DIPARTIMENTO DI SCIENZA DEI MATERIALI
Raman Spectroscopy of Si1-xGex Epilayers
2005 Pezzoli, F; Martinelli, L; Grilli, E; Guzzi, M; Sanguinetti, S; Bollani, M; Chrastina, H; Isella, G; von Känel, H; Wintersberger, E; Stangl, J; Bauer, G
Strain-induced shift of phonon modes in Si1-xGex alloys
2006 Pezzoli, F; Grilli, E; Guzzi, M; Sanguinetti, S; Chrastina, D; Isella, G; von Kanel, H; Wintersberger, E; Stangl, J; Bauer, G
Modelling of the phonon strain shift coefficients in Si 1-x Ge x alloys
2007 Pezzoli, F; Sanguinetti, S; Bonera, E; Grilli, E; Guzzi, M
Erratum to 'Raman spectroscopy of Si1−xGex epilayers' [Mater. Sci. Eng. B 124–125 (2005) 127–131]
2007 Pezzoli, F; Martinelli, L; Grilli, E; Guzzi, M; Sanguinetti, S; Bollani, M; Chrastina, H; Isella, G; Kaenel, H; Wintersberger, E; Stangl, J; Bauer, G
Raman spectroscopy determination of composition and strain in Si1-xGex/Si heterostructures
2008 Pezzoli, F; Bonera, E; Grilli, E; Guzzi, M; Sanguinetti, S; Chrastina, D; Isella, G; Kaenel, H; Wintersberger, E; Stangl, J; Bauer, G
Phonon strain shift coefficients in SixGe1-x alloys
2008 Pezzoli, F; Bonera, E; Grilli, E; Guzzi, M; Sanguinetti, S; Chrastina, D; Isella, G; von Känel, H; Wintersberger, E; Stangl, J; Bauer, G
Strain in a single ultrathin silicon layer on top of SiGe islands: Raman spectroscopy and simulations
2009 Bonera, E; Pezzoli, F; Picco, A; Vastola, G; Stoffel, M; Grilli, E; Guzzi, M; Rastelli, A; Schmidt, O; Miglio, L
Raman spectroscopy for the analysis of temperature-dependent plastic relaxation of SiGe layers
2009 Pezzoli, F; Bonera, E; Bollani, M; Sanguinetti, S; Grilli, E; Guzzi, M; Isella, G; Chrastina, D; von Känel, H
Impact of misfit dislocation on wavefront distortion in Si/SiGe/Si optical waveguides
2009 Trita, A; Bragheri, F; Cristiani, I; Degiorgio, V; Chrastina, D; Colombo, D; Isella, G; von Känel, H; Gramm, F; Müller, E; Döbeli, M; Bonera, E; Gatti, R; Pezzoli, F; Grilli, E; Guzzi, M; Miglio, L
Spin resonance of electrons confined by SiGe nanostructures
2010 Lipps, F; Pezzoli, F; Stoffel, M; Rastelli, A; Kataev, V; Schmidt, O; Büchner, B
Collective Shape Oscillations of SiGe Islands on Pit-Patterned Si(001) Substrates: A Coherent-Growth Strategy Enabled by Self-Regulated Intermixing
2010 Zhang, J; Montalenti, F; Rastelli, A; Hrauda, N; Scopece, D; Groiss, H; Stangl, J; Pezzoli, F; Schaffler, F; Schmidt, O; Miglio, L; Bauer, G
Identifying spins states on self assembled Si/SiGe quantum dots by means of ESR
2010 Lipps, F; Pezzoli, F; Stoffel, M; Deneke, C; Thomas, J; Rastelli, A; Kataev, V; Schmidt, O; Büchner, B
Robust optical orientation of spins in Ge/SiGe quantum wells
2011 Pezzoli, F; Bottegoni, F; Isella, G; Gatti, E; Grilli, E; Ciccacci, F; Guzzi, M
Self-Ordering of Misfit Dislocation Segments in Epitaxial SiGe Islands on Si(001)
2011 Boioli, F; Zinovyev, V; Gatti, R; Marzegalli, A; Montalenti, F; Stoffel, M; Merdzhanova, T; Wang, L; Pezzoli, F; Rastelli, A; Schmidt, O; Miglio, L
Integration of MOSFETs with SiGe dots as stressor material
2011 Nanver, L; Jovanovic, V; Biasotto, C; Moers, J; Grützmacher, D; Zhang, J; Hrauda, N; Stoffel, M; Pezzoli, F; Schmidt, O; Miglio, L; Kosina, H; Marzegalli, A; Vastola, G; Mussler, G; Stangl, J; Bauer, G; Cingel, J; Bonera, E
Strain engineering of silicon-germaium (SiGe) micro- and nanostructures
2011 Pezzoli, F; Deneke, C; Schmidt, O
Optical spin injection in SiGe heterostructures
2011 Isella, G; Bottegoni, F; Pezzoli, F; Cecchi, S; Gatti, E; Chrastina, D; Grilli, E; Guzzi, M; Ciccacci, F
Spin Generation and Relaxation in Ge/SiGe Quantum Wells
2012 Isella, G; Bottegoni, F; Cecchi, S; Ferrari, A; Ciccacci, F; Pezzoli, F; Giorgioni, A; Gatti, E; Grilli, E; Guzzi, M; Lange, C; Koester, N; Woscholski, R; Chatterjee, S; Trivedi, D; Li, P; Song, Y; Dery, H
Three dimensional heteroepitaxy: A new path for monolithically integrating mismatched materials with silicon
2012 Falub, C; Kreiliger, T; Taboada, A; Isa, F; Chrastina, D; Isella, G; Muller, E; Meduna, M; Bergamaschini, R; Marzegalli, A; Bonera, E; Pezzoli, F; Miglio, L; Niedermann, P; Neels, A; Pezous, A; Kaufmann, R; Dommann, A; Kanel, H
Composition profiling of inhomogeneous SiGe nanostructures by Raman spectroscopy
2012 Picco, A; Bonera, E; Pezzoli, F; Grilli, E; Schmidt, O; Isa, F; Cecchi, S; Guzzi, M