Sfoglia per Autore
An exceptional thermal strain reduction in Ge suspended layer grown on Si by a tilting pillar architecture
2016 Marzegalli, A; Cortinovis, A; BASSO BASSET, F; Bonera, E; Pezzoli, F; Scaccabarozzi, A; Isa, F; Isella, G; Zaumseil, P; Capellini, G; Schröder, T; Miglio, L
Anisotropic extended misfit dislocations in overcritical SiGe films by local substrate patterning
2016 Bollani, M; Chrastina, D; Ruggeri, R; Nicotra, G; Gagliano, L; Bonera, E; Mondiali, V; Marzegalli, A; Montalenti, F; Spinella, C; Miglio, L
Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling
2016 Meduňa, M; Falub, C; Isa, F; Marzegalli, A; Chrastina, D; Isella, G; Miglio, L; Dommann, A; Von Känel, H
Photodetection in Hybrid Single-Layer Graphene/Fully Coherent Germanium Island Nanostructures Selectively Grown on Silicon Nanotip Patterns
2016 Niu, G; Capellini, G; Lupina, G; Niermann, T; Salvalaglio, M; Marzegalli, A; Schubert, M; Zaumseil, P; Krause, H; Skibitzki, O; Lehmann, M; Montalenti, F; Xie, Y; Schroeder, T
3C-SiC epitaxy on deeply patterned Si(111) substrates
2016 Kreiliger, T; Mauceri, M; Puglisi, M; Mancarella, F; La Via, F; Crippa, D; Kaplan, W; Schoner, A; Marzegalli, A; Miglio, L; von Kanel, H
InAs/GaAs Sharply Defined Axial Heterostructures in Self-Assisted Nanowires
2015 Scarpellini, D; Somaschini, C; Fedorov, A; Bietti, S; Frigeri, C; Grillo, V; Esposito, L; Salvalaglio, M; Marzegalli, A; Montalenti, F; Bonera, E; Medaglia, P; Sanguinetti, S
Engineered coalescence of three-dimensional Ge microcrystals into high-quality suspended layers on Si pillars
2015 Bergamaschini, R; Salvalaglio, M; Isa, F; Scaccabarozzi, A; Isella, G; Backofen, A; Voigt, A; Marzegalli, A; Capellini, G; Skibitzki, O; Yamamoto, Y; Schroeder, T; von Känel, H; Montalenti, F; Miglio, L
Continuum modeling of heteroepitaxial growth on silicon: elastic relaxation, surface-energy minimization, misfit dislocations and intermixing.
2015 Montalenti, F; Bergamaschini, R; Salvalaglio, M; Backofen, R; Rovaris, F; Albani, M; Marzegalli, A; Voigt, A; Miglio, L
Continuum modeling of heteroepitaxial growth: elastic relaxation, surface-energy minimization, misfit dislocations and intermixing
2015 Montalenti, F; Bergamaschini, R; Salvalaglio, M; Backofen, R; Rovaris, F; Albani, M; Marzegalli, A; Voigt, A; Miglio, L
Imaging structure and composition homogeneity of 300 mm SiGe virtual substrates for advanced CMOS applications by scanning X-ray diffraction microscopy
2015 Zoellner, M; Richard, M; Chahine, G; Zaumseil, P; Reich, C; Capellini, G; Montalenti, F; Marzegalli, A; Xie, Y; Schülli, T; Häberlen, M; Storck, P; Schroeder, T
Burgers Vector Analysis of Vertical Dislocations in Ge Crystals by Large-Angle Convergent Beam Electron Diffraction
2015 Groiss, H; Glaser, M; Marzegalli, A; Isa, F; Isella, G; Miglio, L; Schaffler, F
Epitaxial Ge-crystal arrays for X-ray detection
2014 Kreiliger, T; Falub, C; Isa, F; Isella, G; Chrastina, G; Bergamaschini, R; Marzegalli, A; Kaufmann, R; Niedermann, P; Neels, A; Muller, E; Meduna, M; Dommann, A; Miglio, L; von Kanel, H
3D heteroepitaxy of mismatched semiconductors on silicon
2014 Falub, C; Taboada, A; Kreiliger, T; Isa, F; Chrastina, D; Isella, G; Meduňa, M; Pezzoli, F; Bergamaschini, R; Marzegalli, A; Miglio, L; Müller, E; Neels, A; Niedermann, P; Dommann, A; Känel, H
Epitaxial self-assembly of 3-D semiconductor structures on deeply patterned Si substrates at the microscale
2014 Miglio, L; Bergamaschini, R; Bietti, S; Bonera, E; Grilli, E; Guzzi, M; Marzegalli, A; Montalenti, F; Pezzoli, F; Salvalaglio, M; Sanguinetti, S; Scaccabarozzi, A; Falub, C; Isa, F; Kreiliger, T; Taboada, A; Chrastina, D; Frigerio, I; Isella, G; Meduna, M; Wewior, L; Fuster, D; Alen, B; Bollani, M; Dommann, A; Neels, A; Niedermann, P; Frigeri, C; Fompeyrine, J; Richter, M; Uccelli, E; Mancarella, F; von Kanel, H
Fully coherent growth of Ge on free-standing Si(001) nanomesas
2014 Montalenti, F; Salvalaglio, M; Marzegalli, A; Zaumseil, P; Capellini, G; Schülli, T; Schubert, M; Yamamoto, Y; Tillack, B; Schroeder, T
Understanding complex dislocation behavior and reactions in advanced GeSi epitaxy
2014 Marzegalli, A
Three-dimensional EpitaxialSi1-xGex, Ge and SiC Crystals onDeeply Patterned Si substrates
2014 von Känel, H; Isa, F; Falub, C; Barthazy, E; Müller, E; Chrastina, D; Isella, G; Kreiliger, T; Taboada, A; Meduňa, M; Kaufmann, R; Neels, A; Dommann, A; Niedermann, P; Mancarella, F; Mauceri, M; Puglisi, M; Crippa, D; La Via, F; Anzalone, R; Piluso, N; Bergamaschini, R; Marzegalli, A; Miglio, L
Si CMOS compatible, compliant integration of lattice-mismatched semiconductors on Si(001): Example of fully coherent Ge/Si nanostructures
2014 Montalenti, F; Salvalaglio, M; Marzegalli, A; Zaumseil, P; Capellini, G; Schülli, T; Schubert, M; Yamamoto, Y; Tillack, B; Schroeder, T
Onset of plastic relaxation in the growth of Ge on Si(001) at low temperatures: Atomic-scale microscopy and dislocation modeling
2013 Marzegalli, A; Brunetto, M; Salvalaglio, M; Montalenti, F; Nicotra, G; Scuderi, M; Spinella, C; De Seta, M; Capellini, G
Dislocation assessment and their elimination in high-quality Ge microcrystals integrated on deeply patterned Si (001) substrates
2013 Isa, F; Pezzoli, F; Marzegalli, A; Bergamaschini, R; Salvalaglio, M; Falub, C; Müller, E; Taboada, A; Groiss, H; Kreiliger, T; Isella, G; Montalenti, F; Grilli, E; Guzzi, M; Niedermann, P; Schäffler, F; von Kaenel, H; Miglio, L
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