MARZEGALLI, ANNA
MARZEGALLI, ANNA
DIPARTIMENTO DI SCIENZA DEI MATERIALI
Formation of strain-induced Si-rich and Ge-rich nanowires at misfit dislocations in SiGe: A model supported by photoluminescence data
2004 Martinelli, L; Marzegalli, A; Raiteri, P; Bollani, M; Montalenti, F; Miglio, L; Chrastina, D; Isella, G; von Kanel, H
Relaxed SiGe heteroepitaxy on Si with very thin buffer layers: experimental LEPECVD indications and an interpretation based on strain- dependent dislocation nature
2004 Marzegalli, A; Montalenti, F; Bollani, A; Miglio, L; Isella, G; Chrastina, D; von Kanel, H
Atomistic simulation of a 60 degrees shuffle dislocation segment migrating in a Ge/SiGe(001) epitaxial film
2005 Marzegalli, A; Montalenti, F; Miglio, L
Stability of shuffle and glide dislocation segments with increasing misfit in Ge/Si1-xGex(001) epitaxial layers
2005 Marzegalli, A; Montalenti, F; Miglio, L
Optical properties of shuffle dislocations in silicon
2006 Pizzini, S; Binetti, S; LE DONNE, A; Marzegalli, A; Rabier, J
Critical shape and size for dislocation nucleation in si1-xGex islands on Si(001)
2007 Marzegalli, A; Zinovyev, V; Montalenti, F; Rastelli, A; Stoffel, M; Merdzhanova, T; Schmidt, O; Miglio, L
Vertical and lateral ordering of Ge islands grown on Si(001): Theory and experiments
2007 Montalenti, F; Marzegalli, A; Capellini, G; De Seta, M; Miglio, L
Modeling the plastic relaxation onset in realistic SiGe islands on Si(001)
2008 Gatti, R; Marzegalli, A; Zinovyev, V; Montalenti, F; Miglio, L
Detailed Analysis of the Shape-dependent Deformation Field in 3D Ge Islands
2008 Vastola, G; Gatti, R; Marzegalli, A; Montalenti, F; Miglio, L
Strain and strain-release engineering at epitaxial SiGe islands on Si(0 0 1) for microelectronic applications
2009 Vastola, G; Marzegalli, A; Montalenti, F; Miglio, L
Self-aligned epitaxy in a mask-less deposition with kinetic and geometric constraints
2011 von Kanel, A; Falub, C; Isa, F; Chrastina, D; Isella, G; Niedermann, P; Neels, A; Dommann, A; Muller, E; Gatti, R; Marzegalli, A; Bergamaschini, R; Miglio, L
Dislocation trapping in epitaxial islands, escavated trenches and pits: nanoscale laboratories for simulations and experiments
2011 Miglio, L; Boioli, F; Gatti, R; Marzegalli, A; Montalenti, F
Integration of MOSFETs with SiGe dots as stressor material
2011 Nanver, L; Jovanovic, V; Biasotto, C; Moers, J; Grützmacher, D; Zhang, J; Hrauda, N; Stoffel, M; Pezzoli, F; Schmidt, O; Miglio, L; Kosina, H; Marzegalli, A; Vastola, G; Mussler, G; Stangl, J; Bauer, G; Cingel, J; Bonera, E
Self-Ordering of Misfit Dislocation Segments in Epitaxial SiGe Islands on Si(001)
2011 Boioli, F; Zinovyev, V; Gatti, R; Marzegalli, A; Montalenti, F; Stoffel, M; Merdzhanova, T; Wang, L; Pezzoli, F; Rastelli, A; Schmidt, O; Miglio, L
Strained MOSFETs on ordered SiGe dots
2011 Cervenka, J; Kosina, H; Selberherr, S; Zhang, J; Hrauda, N; Stangl, J; Bauer, G; Vastola, G; Marzegalli, A; Montalenti, F; Miglio, L
Three dimensional heteroepitaxy: A new path for monolithically integrating mismatched materials with silicon
2012 Falub, C; Kreiliger, T; Taboada, A; Isa, F; Chrastina, D; Isella, G; Muller, E; Meduna, M; Bergamaschini, R; Marzegalli, A; Bonera, E; Pezzoli, F; Miglio, L; Niedermann, P; Neels, A; Pezous, A; Kaufmann, R; Dommann, A; Kanel, H
Space-filling Arrays of Three-Dimensional Epitaxial Ge and Si 1-xGe x Crystals
2012 Falub, C; Isa, F; Kreiliger, T; Bergamaschini, R; Marzegalli, A; Taboada, A; Chrastina, D; Isella, G; Muller, E; Niedermann, P; Dommann, A; Neels, A; Pezous, A; Meduna, M; Miglio, L; von Kanel, H
Scaling Hetero-Epitaxy from Layers to Three-Dimensional Crystals
2012 Falub, C; von Kaenel, H; Isa, F; Bergamaschini, R; Marzegalli, A; Chrastina, D; Isella, G; Mueller, E; Niedermann, P; Miglio, L
3D heteroepitaxy on patterned Si substrates: a new monolithic integration strategy
2013 Sanguinetti, S; Bergamaschini, R; Bietti, S; Isa, F; Isella, G; Marzegalli, A; Frigeri, C; Montalenti, F; Pezzoli, F; Scaccabarozzi, A; Falub, C; von Kaenel, H; Miglio, L
"Divide et impera" in detector technology
2013 Miglio, L; Bergamaschini, R; Marzegalli, A; Isa, F; Chrastina, D; Isella, G; Niedermann, P; Dommann, A; Falub, C; Müller, E; von Känel, H