ROVARIS, FABRIZIO
ROVARIS, FABRIZIO
DIPARTIMENTO DI SCIENZA DEI MATERIALI
Stress-Induced Acceleration and Ordering in Solid-State Dewetting
2022 Boccardo, F; Rovaris, F; Tripathi, A; Montalenti, F; Pierre-Louis, O
Machine learning potential for interacting dislocations in the presence of free surfaces
2022 Lanzoni, D; Rovaris, F; Montalenti, F
A machine learning approach for studying low-energy dislocation distributions: methodology and applications to Ge/Si(001) films
2021 Lanzoni, D; Rovaris, F; Montalenti, F
Continuum modeling of heteroepitaxy at the mesoscale: tackling elastic and plastic relaxation
2020 Rovaris, F
Computational analysis of low-energy dislocation configurations in graded layers
2020 Lanzoni, D; Rovaris, F; Montalenti, F
Reduction of threading dislocation density beyond the saturation limit by optimized reverse grading
2020 Skibitzki, O; Zoellner, M; Rovaris, F; Schubert, M; Yamamoto, Y; Persichetti, L; Di Gaspare, L; De Seta, M; Gatti, R; Montalenti, F; Capellini, G
Controlling the relaxation mechanism of low strain Si1- x Gex /Si(001) layers and reducing the threading dislocation density by providing a preexisting dislocation source
2020 Becker, L; Storck, P; Schulz, T; Zoellner, M; Di Gaspare, L; Rovaris, F; Marzegalli, A; Montalenti, F; De Seta, M; Capellini, G; Schwalb, G; Schroeder, T; Albrecht, M
Modeling the dynamics of cross-hatch evolution in heteroepitaxy
2019 Rovaris, F; Zoellner, M; Zaumseil, P; Marzegalli, A; Di Gaspare, L; De Seta, M; Schroeder, T; Storck, P; Schwalb, G; Capellini, G; Montalenti, F
Dynamics of crosshatch patterns in heteroepitaxy
2019 Rovaris, F; Zoellner, M; Zaumseil, P; Marzegalli, A; Di Gaspare, L; De Seta, M; Schroeder, T; Storck, P; Schwalb, G; Capellini, G; Montalenti, F
Theoretical interpretation of tilting-angle maps in heteroepitaxial films
2018 Rovaris, F; Zoellner, M; Zaumseil, P; Schubert, M; Capellini, G; Schroeder, T; Storck, P; Haeberlen, M; Schwalb, G; Richter, C; Schulli, T; Marzegalli, A; Montalenti, F
Dynamics of cross-hatch evolution in heteroepitaxy
2018 Rovaris, F; Zoellner, M; Zaumseil, P; Schubert, M; Di Gaspare, L; De Seta, M; Capellini, G; Schroeder, T; Storck, P; Haeberlen, M; Schwalb, G; Richter, C; Schülli, T; Marzegalli, A; Montalenti, F
Multi-Scale Modeling of Plasticity: a Coupling between Dislocation Dynamics and FEniCS
2018 Rovaris, F; Gatti, R
SiGe/Si Vertical Heterostructures: Switching the Dislocation Sign by Substrate Under-Etching
2018 Rovaris, F; Isa, F; Gatti, R; Jung, A; Isella, G; Montalenti, F; von Kaenl, H
Dislocation-free SiGe/Si heterostructures
2018 Montalenti, F; Rovaris, F; Bergamaschini, R; Miglio, L; Salvalaglio, M; Isella, G; Isa, F; von Känel, H
Misfit-Dislocation Distributions in Heteroepitaxy: From Mesoscale Measurements to Individual Defects and Back
2018 Rovaris, F; Zoellner, M; Zaumseil, P; Schubert, M; Marzegalli, A; Di Gaspare, L; De Seta, M; Schroeder, T; Storck, P; Schwalb, G; Richter, C; Schülli, T; Capellini, G; Montalenti, F
Modeling semiconductor heteroepitaxy: a continuum approach
2017 Albani, M; Bergamaschini, R; Rovaris, F; Miglio, L; Montalenti, F
Modeling the competition between elastic and plastic relaxation in semiconductor heteroepitaxy: From cyclic growth to flat films
2017 Rovaris, F; Bergamaschini, R; Montalenti, F
Misfit relaxation in heteroepitaxy: A theoretical method for inferring individual dislocation positions from tilting maps
2017 Rovaris, F; Zoellner, M; Chahine, G; Zaumseil, P; Storck, P; Haeberlen, M; Marzegalli, A; Schroeder, T; Capellini, G; Montalenti, F
Dislocation Dynamics Simulations of Three-dimensional SiGe/Si Heterostructures: Switching the Dislocation Sign by Substrate Under- etching
2017 Rovaris, F; Isa, F; Gatti, R; Jung, A; Isella, G; Montalenti, F; von Kaenel, H
Three-dimensional SiGe/Si heterostructures: Switching the dislocation sign by substrate under-etching
2017 Rovaris, F; Isa, F; Gatti, R; Jung, A; Isella, G; Montalenti, F; von Kaenel, H