Sfoglia per Autore
Photoluminescence of dislocations in nitrogen doped Czochralski silicon
2004 Li, D; Yang, D; Leoni, E; Binetti, S; Pizzini, S
Electrical characterization of electron irradiated X-rays detectors based on 4H-SiC epitaxial layers
2004 LE DONNE, A; Binetti, S; Acciarri, M; Pizzini, S
Effect of high pressure isostatic annealing on oxygen segregation in Czochralski silicon
2003 Binetti, S; LE DONNE, A; Emtsev, V; Pizzini, S
Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy
2003 Binetti, S; LE DONNE, A; Acciarri, M; Cerminara, M; Pizzini, S
Characterization of Nanocrystalline Silicon Film grown by LEPECVD for Photovoltaic Applications
2003 Bollani, M; Binetti, S; Acciarri, M; Fumagalli, L; Arcari, A; Pizzini, S; Von Känel, H
Dislocation luminescence in nitrogen-doped Czochralski and float zone silicon
2002 Binetti, S; Somaschini, R; LE DONNE, A; Leoni, E; Pizzini, S; Li, D; Yang, D
Optical properties of oxygen precipitates and dislocations in silicon
2002 Binetti, S; Pizzini, S; Leoni, E; Somaschini, R; Castaldini, A; Cavallini, A
Fast LBIC in-line characterization for process quality control in the photovoltaic industry
2002 Acciarri, M; Binetti, S; Racz, A; Pizzini, S; Agostinelli, G
Beam injection studies of dislocations and oxygen precipitates in semiconductor silicon
2001 Pizzini, S; Binetti, S; LE DONNE, A; Leoni, E; Acciarri, M; Salviati, G; Lazzarini, L
Surface microcharacterization of silicon wafers by the light-beam-induced current technique in the planar configuration and by attenuated total reflection spectroscopy
2000 Spadoni, S; Acciarri, M; Narducci, D; Pizzini, S
Local structure of erbium-oxygen complexes in erbium-doped silicon and its correlation with the optical activity of erbium
2000 Pizzini, S; Binetti, S; Calcina, D; Morgante, N; Cavallini, A
Advances in silicon surface characterisation using light beam injection techniques
2000 Acciarri, M; Pizzini, S; Simone, G; Jones, D; Palermo, V
The photoluminescence emission in the 0.7-0.9 eV range from oxygen precipitates, thermal donors and dislocations in silicon
2000 Pizzini, S; Guzzi, M; Grilli, E; Borionetti, G
Electrical and optical characterization of Er-doped silicon grown by liquid phase epitaxy
1999 Cavallini, A; Fraboni, B; Pizzini, S; Binetti, S; Sanguinetti, S; Lazzarini, L; Salviati, G; Acciarri, M; Binetti, S
Erbium-doped silicon epilayers grown by liquid-phase epitaxy
1998 Binetti, S; Cavallini, A; Dellafiore, A; Fraboni, B; Grilli, E; Guzzi, M; Pizzini, S; Sanguinetti, S
Application of surface science to preparation and characterization of solid-state chemical sensors
1996 Narducci, D; Gilardi, G; Mari, C; Pizzini, S
Analysis of the High-Temperature Degradation of Gas Sensors Based on Oxide Semiconductors
1995 Narducci, D; Girardi, G; Romalelli, C; Pizzini, S
Interfacial issues in the design and the making of solid state chemical sensors
1995 Narducci, D; Girardi, G; Mari, C; Pizzini, S
Coordination of zinc and copper in phosphate glasses by EXAFS
1991 Musinu, A; Piccaluga, G; Pinna, G; Vlaic, G; Narducci, D; Pizzini, S
Electrochemical solid state sensor for SO2 determination in air
1990 Mari, C; Beghi, M; Pizzini, S; Faltemier, J
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