ACCIARRI, MAURIZIO FILIPPO
ACCIARRI, MAURIZIO FILIPPO
DIPARTIMENTO DI SCIENZA DEI MATERIALI
Electrical and optical characterization of Er-doped silicon grown by liquid phase epitaxy
1999 Cavallini, A; Fraboni, B; Pizzini, S; Binetti, S; Sanguinetti, S; Lazzarini, L; Salviati, G; Acciarri, M; Binetti, S
Advances in silicon surface characterisation using light beam injection techniques
2000 Acciarri, M; Pizzini, S; Simone, G; Jones, D; Palermo, V
Surface microcharacterization of silicon wafers by the light-beam-induced current technique in the planar configuration and by attenuated total reflection spectroscopy
2000 Spadoni, S; Acciarri, M; Narducci, D; Pizzini, S
Beam injection studies of dislocations and oxygen precipitates in semiconductor silicon
2001 Pizzini, S; Binetti, S; LE DONNE, A; Leoni, E; Acciarri, M; Salviati, G; Lazzarini, L
Fast LBIC in-line characterization for process quality control in the photovoltaic industry
2002 Acciarri, M; Binetti, S; Racz, A; Pizzini, S; Agostinelli, G
Nanocrystalline SnO2-Based Thin Films Obtained by Sol-Gel Route: A Morphological and Structural Investigation
2003 Acciarri, M; Canevali, C; Mari, C; Mattoni, M; Ruffo, R; Scotti, R; Morazzoni, F; Barreca, D; Armelao, L; Tondello, E; Bontempi, E; Depero, L
Characterization of Nanocrystalline Silicon Film grown by LEPECVD for Photovoltaic Applications
2003 Bollani, M; Binetti, S; Acciarri, M; Fumagalli, L; Arcari, A; Pizzini, S; Von Känel, H
Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy
2003 Binetti, S; LE DONNE, A; Acciarri, M; Cerminara, M; Pizzini, S
Electrical and Optical Properties of Dislocations Generated under Pure Conditions
2004 Acciarri, M; Binetti, S; Feklisova, O; Steinman, E; Yakimov, E
The origin of photoluminescence from oxygen precipitates nucleated at low temperature in semiconductor silicon
2004 Leoni, E; Martinelli, L; Binetti, S; Borionetti, G; Pizzini, S; Acciarri, M
Electrical characterization of electron irradiated X rays detectors based on 4H-SiC epitaxial layers
2004 LE DONNE, A; Binetti, S; Acciarri, M; Pizzini, S
Luminescence of Dislocations and Oxide Precipitates in Si
2004 Pizzini, S; Leoni, E; Binetti, S; Acciarri, M; LE DONNE, A; Pichaud, B
Nanocrystalline silicon film grown by LEPECVD for photovoltaic applications
2005 Acciarri, M; Binetti, S; Bollani, M; Fumagalli, L; Pizzini, S; von Kanel, H
Ruthenium(platinum)-doped tin dioxide inverted opals for gas sensors: Synthesis, electron paramagnetic resonance, Mossbauer, and electrical investigation
2005 Acciarri, M; Barberini, R; Canevali, C; Mattoni, M; Mari, C; Morazzoni, F; Nodari, L; Polizzi, S; Ruffo, R; Russo, U; Sala, M; Scotti, R
Processing step related upgrading of silicon based solar cells detected by photoluminescence spectroscopy
2005 Binetti, S; LE DONNE, A; Acciarri, M
Nanocrystalline silicon films grown by low energy plasma enhanced chemical vapor deposition for optoelectronic applications
2005 Binetti, S; Acciarri, M; Bollani, M; Fumagalli, L; von Kanel, H; Pizzini, S
Electron-beam-induced current imaging for the characterisation of structural defects in Si1-xGex films grown by LE-PECVD
2006 Virtuani, A; Marchionna, S; Acciarri, M; Isella, G; von Kaenel, H
Defect imaging of SiGe strain relaxed buffers grown by LEPECVD
2006 Marchionna, S; Virtuani, A; Acciarri, M; Isella, G; von Kaenel, H
Photovoltaic quantum efficiency enhancement by light harvesting of organo-lanthanide complexes
2006 Marchionna, S; Meinardi, F; Acciarri, M; Papagni, A; Binetti, S; Pizzini, S; Malatesta, V; Tubino, R
Defect studies on silicon and silicon–germanium for PV and optoelectronic applications
2006 Pizzini, S; Acciarri, M; Binetti, S; LE DONNE, A; Marchionna, S; Bollani, M