ACCIARRI, MAURIZIO FILIPPO

ACCIARRI, MAURIZIO FILIPPO  

DIPARTIMENTO DI SCIENZA DEI MATERIALI  

Mostra records
Risultati 1 - 20 di 124 (tempo di esecuzione: 0.043 secondi).
Titolo Tipologia Data di pubblicazione Autori File
Electrical and optical characterization of Er-doped silicon grown by liquid phase epitaxy 01 - Articolo su rivista 1999 Pizzini, SSANGUINETTI, STEFANOACCIARRI, MAURIZIO FILIPPOBINETTI, SIMONA OLGA +
Advances in silicon surface characterisation using light beam injection techniques 01 - Articolo su rivista 2000 ACCIARRI, MAURIZIO FILIPPOPIZZINI, SERGIO +
Surface microcharacterization of silicon wafers by the light-beam-induced current technique in the planar configuration and by attenuated total reflection spectroscopy 01 - Articolo su rivista 2000 ACCIARRI, MAURIZIO FILIPPONARDUCCI, DARIOPizzini, S. +
Beam injection studies of dislocations and oxygen precipitates in semiconductor silicon 01 - Articolo su rivista 2001 Pizzini, SBINETTI, SIMONA OLGALE DONNE, ALESSIAACCIARRI, MAURIZIO FILIPPO +
Fast LBIC in-line characterization for process quality control in the photovoltaic industry 01 - Articolo su rivista 2002 Acciarri, MFBinetti, SOPizzini, S +
Characterization of Nanocrystalline Silicon Film grown by LEPECVD for Photovoltaic Applications 02 - Intervento a convegno 2003 BINETTI, SIMONA OLGAACCIARRI, MAURIZIO FILIPPOPizzini, S +
Nanocrystalline SnO2-Based Thin Films Obtained by Sol-Gel Route: A Morphological and Structural Investigation 01 - Articolo su rivista 2003 ACCIARRI, MAURIZIO FILIPPOCANEVALI, CARMENMARI, CLAUDIO MARIARUFFO, RICCARDOSCOTTI, ROBERTOMORAZZONI, FRANCA +
Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy 03 - Contributo in libro 2003 BINETTI, SIMONA OLGALE DONNE, ALESSIAACCIARRI, MAURIZIO FILIPPOPizzini, S. +
The origin of photoluminescence from oxygen precipitates nucleated at low temperature in semiconductor silicon 01 - Articolo su rivista 2004 BINETTI, SIMONA OLGAPIZZINI, SERGIOACCIARRI, MAURIZIO FILIPPO +
Electrical and Optical Properties of Dislocations Generated under Pure Conditions 01 - Articolo su rivista 2004 ACCIARRI, MAURIZIO FILIPPOBINETTI, SIMONA OLGA +
Luminescence of Dislocations and Oxide Precipitates in Si 01 - Articolo su rivista 2004 Pizzini, SBINETTI, SIMONA OLGAACCIARRI, MAURIZIO FILIPPOLE DONNE, ALESSIA +
Electrical characterization of electron irradiated X rays detectors based on 4H-SiC epitaxial layers 01 - Articolo su rivista 2004 LE DONNE, ALESSIABINETTI, SIMONA OLGAACCIARRI, MAURIZIO FILIPPOPizzini, S.
Processing step related upgrading of silicon based solar cells detected by photoluminescence spectroscopy 01 - Articolo su rivista 2005 BINETTI, SIMONA OLGALE DONNE, ALESSIAACCIARRI, MAURIZIO FILIPPO
Nanocrystalline silicon film grown by LEPECVD for photovoltaic applications 01 - Articolo su rivista 2005 ACCIARRI, MAURIZIO FILIPPOBINETTI, SIMONA OLGAPizzini,S +
Ruthenium(platinum)-doped tin dioxide inverted opals for gas sensors: Synthesis, electron paramagnetic resonance, Mossbauer, and electrical investigation 01 - Articolo su rivista 2005 ACCIARRI, MAURIZIO FILIPPOCANEVALI, CARMENMARI, CLAUDIO MARIAMORAZZONI, FRANCARUFFO, RICCARDOSCOTTI, ROBERTO +
Nanocrystalline silicon films grown by low energy plasma enhanced chemical vapor deposition for optoelectronic applications 01 - Articolo su rivista 2005 BINETTI, SIMONA OLGAACCIARRI, MAURIZIO FILIPPOPIZZINI, SERGIO +
Photovoltaic quantum efficiency enhancement by light harvesting of organo-lanthanide complexes 01 - Articolo su rivista 2006 MEINARDI, FRANCESCOACCIARRI, MAURIZIO FILIPPOPAPAGNI, ANTONIOBINETTI, SIMONA OLGAPIZZINI, SERGIOTUBINO, RICCARDO +
Nanocrystalline silicon films as multifunctional material for optoelectronic and photovoltaic applications 01 - Articolo su rivista 2006 Pizzini, SACCIARRI, MAURIZIO FILIPPOBINETTI, SIMONA OLGAGRILLI, EMANUELE ENRICOLE DONNE, ALESSIASANGUINETTI, STEFANO +
Precision electroweak measurements on the Z resonance 01 - Articolo su rivista 2006 CALVI, MARTAPAGANONI, MARCOPULLIA, ANTONINORAGAZZI, STEFANOTABARELLI DE FATIS, TOMMASOTERRANOVA, FRANCESCOACCIARRI, MAURIZIO FILIPPOCarpinelli, M +
Electron-beam-induced current imaging for the characterisation of structural defects in Si1-xGex films grown by LE-PECVD 01 - Articolo su rivista 2006 ACCIARRI, MAURIZIO FILIPPO +