Sfoglia per Autore
Mostrati risultati da 1 a 8 di 8
Single-Event Upset Characterization of a Shift Register in 16 nm FinFET Technology
2025 D'Aniello, F; Tettamanti, M; Shah, S; Mattiazzo, S; Bonaldo, S; Vadalà, V; Baschirotto, A
Development of a General-Purpose Board for Debugging Test Solutions for Dual-Channel Gate Drivers Up to 1200 Volts
2025 Shah, S; Baschirotto, A
INTEGRATED READOUT SYSTEMS FOR PARTICLE DETECTORS
2023 Shah, S
65 nm CMOS 8 mV/fC, 14.6 ns Rising Time Analog Front-End for ATLAS Muon Drift Tubes Detectors
2023 Shah, S; Kroha, H; De Matteis, M; Baschirotto, A; Richter, R
A 4-Channel Ultra-Low Power Front-End Electronics in 65 nm CMOS for ATLAS MDT Detectors
2022 Shah, S; De Matteis, M; Kroha, H; Fras, M; Kortner, O; Richter, R; Baschirotto, A
A 4-channel front-end electronics for muon drift tubes detectors in 65 nm CMOS technology
2022 Shah, S; De Matteis, M; Fras, M; Kortner, O; Kroha, H; Richter, R; Baschirotto, A
A Low-Power Bio-potential acquisition for the wearable shockable Electrocardiogram (ECG) System
2021 Ali Shah, S; Ali, M; Bin Altaf, M
Design of Energy-Efficient Electrocorticography Recording System for Intractable Epilepsy in Implantable Environments
2020 Aftab, M; Shah, S; Aslam, A; Saadeh, W; Altaf, M
Mostrati risultati da 1 a 8 di 8
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