Development of a General-Purpose Board for Debugging Test Solutions for Dual-Channel Gate Drivers Up to 1200 Volts

Logic gate drivers are essential components in a wide range of electronic systems, powering everything from mobile phones and workstations to automobiles, industrial automation, and home appliances. Designing these drivers involves challenges like high switching speeds, thermal stability, and power consumption. A failure can disrupt an entire system, so gate drivers need to meet strict specifications. Rigorous production testing is necessary to identify potential failures, ensuring quality and performance in high-demand applications. Testing of devices with Automatic Test Equipment (ATE) requires using different productive hardware that is very expensive and requires a long time to be developed and produced. An error in the design of the final productive hardware may lead to a substantial increase in development costs and the project timeline, which might compromise the time to market of the product itself. This work focuses on the development of a general-purpose board (2ED-GPB) for debugging the main blocks of a test solution for Dual-channel isolated gate drivers. The main purpose of the 2ED-GPB is to verify the proper behavior of newly introduced features of the test circuitry before manufacturing the final hardware to be used in production, allowing for additional cost savings due to possible redesign needed to fix some bugs or optimize some features.