α,ω-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples.
Campione, M., Borghesi, A., Moret, M., Sassella, A., Lotz, B., & Thierry, A. (2004). Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy. ORGANIC ELECTRONICS, 5(1-3), 141-145 [10.1016/j.orgel.2004.01.003].
Citazione: | Campione, M., Borghesi, A., Moret, M., Sassella, A., Lotz, B., & Thierry, A. (2004). Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy. ORGANIC ELECTRONICS, 5(1-3), 141-145 [10.1016/j.orgel.2004.01.003]. | |
Tipo: | Articolo in rivista - Articolo scientifico | |
Carattere della pubblicazione: | Scientifica | |
Titolo: | Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy | |
Autori: | Campione, M; Borghesi, A; Moret, M; Sassella, A; Lotz, B; Thierry, A | |
Autori: | ||
Data di pubblicazione: | 2004 | |
Lingua: | English | |
Rivista: | ORGANIC ELECTRONICS | |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1016/j.orgel.2004.01.003 | |
Appare nelle tipologie: | 01 - Articolo su rivista |