α,ω-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples.
Campione, M., Borghesi, A., Moret, M., Sassella, A., Lotz, B., Thierry, A. (2004). Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy. ORGANIC ELECTRONICS, 5(1-3), 141-145 [10.1016/j.orgel.2004.01.003].
Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy
CAMPIONE, MARCELLO;BORGHESI, ALESSANDRO;MORET, MASSIMO;SASSELLA, ADELE;
2004
Abstract
α,ω-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples.
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