α,ω-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples.

Campione, M., Borghesi, A., Moret, M., Sassella, A., Lotz, B., & Thierry, A. (2004). Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy. ORGANIC ELECTRONICS, 5(1-3), 141-145 [10.1016/j.orgel.2004.01.003].

Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy

CAMPIONE, MARCELLO;BORGHESI, ALESSANDRO;MORET, MASSIMO;SASSELLA, ADELE;
2004

Abstract

α,ω-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples.
Articolo in rivista - Articolo scientifico
Organic molecular beam deposition; Transmission electron microscopy; Structural characterisation; Thin film growth; Oligothiophenes
English
141
145
Campione, M., Borghesi, A., Moret, M., Sassella, A., Lotz, B., & Thierry, A. (2004). Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy. ORGANIC ELECTRONICS, 5(1-3), 141-145 [10.1016/j.orgel.2004.01.003].
Campione, M; Borghesi, A; Moret, M; Sassella, A; Lotz, B; Thierry, A
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/10281/7641
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