SASSELLA, ADELE

SASSELLA, ADELE  

DIPARTIMENTO DI SCIENZA DEI MATERIALI  

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Risultati 1 - 20 di 218 (tempo di esecuzione: 0.011 secondi).
Titolo Tipologia Data di pubblicazione Autori File
Interaction of ambient gas and meniscus surface during growth of edge-defined film-fed growth polycrystalline silicon samples 01 - Articolo su rivista 1991 BORGHESI, ALESSANDROSASSELLA, ADELE +
Quantitative determination of high-temperature oxygen microprecipitates in Czochralski silicon by micro-Fourier transform infrared spectroscopy 01 - Articolo su rivista 1991 BORGHESI, ALESSANDROSASSELLA, ADELE +
Properties of borophosphosilicate glass films deposited by different chemical vapor deposition techniques 01 - Articolo su rivista 1992 BORGHESI, ALESSANDROSASSELLA, ADELE +
Boron accumulation at epi-substrate silicon interface during epitaxial growth 01 - Articolo su rivista 1992 BORGHESI, ALESSANDROSASSELLA, ADELE +
Effect of annealing on carbon concentration in edge-defined film-fed grown polycrystalline silicon 01 - Articolo su rivista 1992 BORGHESI, ALESSANDROSASSELLA, ADELE +
Infrared determination of interstitial oxygen behavior during epitaxial silicon growth on Czochralski substrates 01 - Articolo su rivista 1992 SASSELLA, ADELEBORGHESI, ALESSANDRO +
Infrared study of oxygen precipitate composition in silicon 01 - Articolo su rivista 1992 BORGHESI, ALESSANDROSASSELLA, ADELE +
Polarization effect on infrared absorption of oxygen precipitates in silicon 01 - Articolo su rivista 1992 BORGHESI, ALESSANDROSASSELLA, ADELE +
Characterization of silicon dioxide and phosphosilicate glass deposited films 01 - Articolo su rivista 1993 Borghesi, ASassella, A +
Stoichiometry of oxygen precipitates in silicon 01 - Articolo su rivista 1993 BORGHESI, ALESSANDROSASSELLA, ADELE +
Characterization of porous silicon inhomogeneities by high spatial resolution infrared spectroscopy 01 - Articolo su rivista 1993 BORGHESI, ALESSANDROSASSELLA, ADELE +
Optical characterization of oxynitride films in the visible-ultraviolet range 01 - Articolo su rivista 1993 BORGHESI, ALESSANDROSASSELLA, ADELE +
Oxygen precipitates in short-time annealed Czochralski silicon 01 - Articolo su rivista 1993 BORGHESI, ALESSANDROSASSELLA, ADELE +
In situ Cr gettering in polycrystalline silicon sheets obtained by edge-defined film-fed growth 01 - Articolo su rivista 1993 Borghesi, ASassella, A +
Ellipsometric characterization of hydrogen-rich oxynitride films 01 - Articolo su rivista 1993 Borghesi, ASassella, A +
Spectroscopic ellipsometry study of the relaxation state of amorphous silicon 01 - Articolo su rivista 1993 BORGHESI, ALESSANDROSASSELLA, ADELE +
Homogeneity of carbon microdistribution in edge-defined film-fed grown polycrystalline silicon 01 - Articolo su rivista 1993 BORGHESI, ALESSANDROSASSELLA, ADELE +
Magnetization and magnetic susceptibility of the diluted magnetic semiconductor Cd1−xMnxGa2Se4 01 - Articolo su rivista 1993 BORGHESI, ALESSANDROSASSELLA, ADELE +
Tetrahedron model for the optical dielectric function of H-rich silicon oxynitride 01 - Articolo su rivista 1993 SASSELLA, ADELE
Induction-model analysis of SiH stretching mode in porous silicon 01 - Articolo su rivista 1994 BORGHESI, ALESSANDROSASSELLA, ADELE +