The problem of monitoring the structural and morphological evolutions of thin films of organic molecular materials during their growth by organic molecular beam epitaxy and in the postgrowth stage is addressed here by a combination of in situ optical reflectance anisotropy measurements, ex situ optical and morphological investigations, and theoretical simulation of the material optical response. For alpha-quaterthiophene, a representative material in the class of organic molecular semiconductors, the results show that molecules crystallize in the first stage of growth in metastable structures, even when deposition is carried out at room temperature. In the postdeposition stage, the film structure evolves within a few days to the known equilibrium structure of the low temperature polymorph. When deposition is carried out at low substrate temperatures, an evolution of the film morphology is also demonstrated. (c) 2007 American Institute of Physics

Campione, M., Borghesi, A., Laicini, M., Sassella, A., Goletti, C., Bussetti, G., et al. (2007). Growth-related properties and postgrowth phenomena in organic molecular thin films. THE JOURNAL OF CHEMICAL PHYSICS, 127(24), 244703 [10.1063/1.2814244].

Growth-related properties and postgrowth phenomena in organic molecular thin films

CAMPIONE, MARCELLO;BORGHESI, ALESSANDRO;SASSELLA, ADELE;
2007

Abstract

The problem of monitoring the structural and morphological evolutions of thin films of organic molecular materials during their growth by organic molecular beam epitaxy and in the postgrowth stage is addressed here by a combination of in situ optical reflectance anisotropy measurements, ex situ optical and morphological investigations, and theoretical simulation of the material optical response. For alpha-quaterthiophene, a representative material in the class of organic molecular semiconductors, the results show that molecules crystallize in the first stage of growth in metastable structures, even when deposition is carried out at room temperature. In the postdeposition stage, the film structure evolves within a few days to the known equilibrium structure of the low temperature polymorph. When deposition is carried out at low substrate temperatures, an evolution of the film morphology is also demonstrated. (c) 2007 American Institute of Physics
Articolo in rivista - Articolo scientifico
molecular materials; thin film growth; in-situ study; post-growth phenomena
English
2007
127
24
244703
none
Campione, M., Borghesi, A., Laicini, M., Sassella, A., Goletti, C., Bussetti, G., et al. (2007). Growth-related properties and postgrowth phenomena in organic molecular thin films. THE JOURNAL OF CHEMICAL PHYSICS, 127(24), 244703 [10.1063/1.2814244].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/481
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