We report on the results obtained with the global CUPID-0 background model, which combines the data collected in the two measurement campaigns for a total exposure of 8.82 kg×yr of Se82. We identify with improved precision the background sources within the 3 MeV energy region, where neutrinoless double β decay of Se82 and Mo100 is expected, making more solid the foundations for the background budget of the next-generation CUPID experiment. Relying on the excellent data reconstruction, we measure the two-neutrino double β-decay half-life of Se82 with unprecedented accuracy: T1/22ν=[8.69±0.05(stat)(-0.06+0.09syst)]×1019 yr.

Azzolini, O., Beeman, J., Bellini, F., Beretta, M., Biassoni, M., Brofferio, C., et al. (2023). Measurement of the 2νββ Decay Half-Life of Se 82 with the Global CUPID-0 Background Model. PHYSICAL REVIEW LETTERS, 131(22) [10.1103/PhysRevLett.131.222501].

Measurement of the 2νββ Decay Half-Life of Se 82 with the Global CUPID-0 Background Model

Beretta M.;Biassoni M.;Brofferio C.;Capelli S.;Carniti P.;Chiesa D.;Clemenza M.;Cremonesi O.;Gironi L.;Giuliani A.;Gorla P.;Gotti C.;Nastasi M.;Nones C.;Pagnanini L.;Pattavina L.;Pavan M.;Pessina G.;Pozzi S.;Previtali E.;
2023

Abstract

We report on the results obtained with the global CUPID-0 background model, which combines the data collected in the two measurement campaigns for a total exposure of 8.82 kg×yr of Se82. We identify with improved precision the background sources within the 3 MeV energy region, where neutrinoless double β decay of Se82 and Mo100 is expected, making more solid the foundations for the background budget of the next-generation CUPID experiment. Relying on the excellent data reconstruction, we measure the two-neutrino double β-decay half-life of Se82 with unprecedented accuracy: T1/22ν=[8.69±0.05(stat)(-0.06+0.09syst)]×1019 yr.
Articolo in rivista - Articolo scientifico
Beta decay, Double beta decay, Nuclear structure & decays, Rare decays
English
2023
131
22
222501
none
Azzolini, O., Beeman, J., Bellini, F., Beretta, M., Biassoni, M., Brofferio, C., et al. (2023). Measurement of the 2νββ Decay Half-Life of Se 82 with the Global CUPID-0 Background Model. PHYSICAL REVIEW LETTERS, 131(22) [10.1103/PhysRevLett.131.222501].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/455880
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