In this paper an automated measurement system for the investigation of degradation phenomena in GaN FETs is presented. The system is able to perform both static and dynamic stress cycles under actual device operation, gathering useful information strictly related to the 'health' of the device. As case study a 75-VDC GaN HEMT was used for a 19-hours stress test, putting in evidence how the device performance slightly degrades during the stress experiment.

Trevisan, F., Raffo, A., Bosi, G., Vadala', V., Vannini, G., Formicone, G., et al. (2017). 75-VDC GaN technology investigation from a degradation perspective. In Proceedings of the 2017 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2017 (pp.1-4). Institute of Electrical and Electronics Engineers Inc. [10.1109/INMMIC.2017.7927302].

75-VDC GaN technology investigation from a degradation perspective

VADALA', Valeria;
2017

Abstract

In this paper an automated measurement system for the investigation of degradation phenomena in GaN FETs is presented. The system is able to perform both static and dynamic stress cycles under actual device operation, gathering useful information strictly related to the 'health' of the device. As case study a 75-VDC GaN HEMT was used for a 19-hours stress test, putting in evidence how the device performance slightly degrades during the stress experiment.
Si
paper
FETs; GaN HEMTs; Reliability; Semiconductor device measurements;
English
2017 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2017 - 20 April 2017 through 21 April 2017
978-150905862-4
https://ieeexplore.ieee.org/document/7927302
Trevisan, F., Raffo, A., Bosi, G., Vadala', V., Vannini, G., Formicone, G., et al. (2017). 75-VDC GaN technology investigation from a degradation perspective. In Proceedings of the 2017 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2017 (pp.1-4). Institute of Electrical and Electronics Engineers Inc. [10.1109/INMMIC.2017.7927302].
Trevisan, F; Raffo, A; Bosi, G; Vadala', V; Vannini, G; Formicone, G; Burger, J; Custer, J
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/380648
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