The low-energy optical response of few-nanometer-thick SiO2 films is reported and compared with theoretical predictions. The limit where the surface effects become fundamental in determining the optical properties of the film is discussed and very good agreement is found between experimental and theoretical results. © 1994 The American Physical Society.

Borghesi, A., Sassella, A. (1994). Experimental evidence of the crossover between bulk and thin-film optics. PHYSICAL REVIEW. B, CONDENSED MATTER, 50(23), 17756-17758 [10.1103/PhysRevB.50.17756].

Experimental evidence of the crossover between bulk and thin-film optics

Borghesi, A;Sassella, A.
1994

Abstract

The low-energy optical response of few-nanometer-thick SiO2 films is reported and compared with theoretical predictions. The limit where the surface effects become fundamental in determining the optical properties of the film is discussed and very good agreement is found between experimental and theoretical results. © 1994 The American Physical Society.
Articolo in rivista - Articolo scientifico
silicon; oxygen precipitation; infrared
English
1994
50
23
17756
17758
none
Borghesi, A., Sassella, A. (1994). Experimental evidence of the crossover between bulk and thin-film optics. PHYSICAL REVIEW. B, CONDENSED MATTER, 50(23), 17756-17758 [10.1103/PhysRevB.50.17756].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/34404
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