The low-energy optical response of few-nanometer-thick SiO2 films is reported and compared with theoretical predictions. The limit where the surface effects become fundamental in determining the optical properties of the film is discussed and very good agreement is found between experimental and theoretical results. © 1994 The American Physical Society.
Borghesi, A., Sassella, A. (1994). Experimental evidence of the crossover between bulk and thin-film optics. PHYSICAL REVIEW. B, CONDENSED MATTER, 50(23), 17756-17758 [10.1103/PhysRevB.50.17756].
Experimental evidence of the crossover between bulk and thin-film optics
Borghesi, A;Sassella, A.
1994
Abstract
The low-energy optical response of few-nanometer-thick SiO2 films is reported and compared with theoretical predictions. The limit where the surface effects become fundamental in determining the optical properties of the film is discussed and very good agreement is found between experimental and theoretical results. © 1994 The American Physical Society.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.