In this paper, a modification of the Angelov DC I/V model is proposed with the aim of improving its accuracy in the back-off condition under Class-B operation yet preserving its excellent prediction capabilities under high output power and saturated operations. Dispersion effects and capacitances are modelled by well-established techniques. As validation, the predictions of the model on S-parameters and load-pull circles at different bias conditions and different input power levels are shown.

Vadalà, V., Raffo, A., Kikuchi, K., Yamamoto, H., Bosi, G., Inoue, K., et al. (2019). GaN HEMT Model with Enhanced Accuracy under Back-off Operation. In 2019 14th European Microwave Integrated Circuits Conference (EuMIC) (pp.37-40). Institute of Electrical and Electronics Engineers Inc. [10.23919/EuMIC.2019.8909567].

GaN HEMT Model with Enhanced Accuracy under Back-off Operation

Valeria Vadalà;Gianni Bosi;
2019

Abstract

In this paper, a modification of the Angelov DC I/V model is proposed with the aim of improving its accuracy in the back-off condition under Class-B operation yet preserving its excellent prediction capabilities under high output power and saturated operations. Dispersion effects and capacitances are modelled by well-established techniques. As validation, the predictions of the model on S-parameters and load-pull circles at different bias conditions and different input power levels are shown.
paper
microwave FET; nonlinear microwave measurements; nonlinear transistor model; power amplifiers;
English
2019 14th European Microwave Integrated Circuits Conference (EuMIC) Held as Part of the 22th European Microwave Week, EuMW 2019
30 settembre - 1 ottobre 2019
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
978-2-87487-056-9
2019
37
40
8909567
https://ieeexplore.ieee.org/document/8909567
none
Vadalà, V., Raffo, A., Kikuchi, K., Yamamoto, H., Bosi, G., Inoue, K., et al. (2019). GaN HEMT Model with Enhanced Accuracy under Back-off Operation. In 2019 14th European Microwave Integrated Circuits Conference (EuMIC) (pp.37-40). Institute of Electrical and Electronics Engineers Inc. [10.23919/EuMIC.2019.8909567].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/343330
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