Reflectance anisotropy spectroscopy (RAS) has been employed to study in situ the growth of thin alpha-sexithiophene films by organic molecular beam deposition onto an organic substrate. A large anisotropy can be detected by following the line shape evolution of the RAS spectrum; in addition, the signal variation at a fixed wavelength is used to monitor the film growth. The signal intensity scales with the deposited thickness, demonstrating a very high sensitivity of RAS to less than 1/50 of a monolayer. Evidence of the advantages of RAS to monitor in real time the growth of molecular films and to probe in situ their properties is therefore obtained. (C) 2003 American Institute of Physics
Goletti, C., Bussetti, G., Chiaradia, P., Sassella, A., Borghesi, A. (2003). Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition. APPLIED PHYSICS LETTERS, 83(20), 4146-4148 [10.1063/1.1626810].
Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition
SASSELLA, ADELE;BORGHESI, ALESSANDRO
2003
Abstract
Reflectance anisotropy spectroscopy (RAS) has been employed to study in situ the growth of thin alpha-sexithiophene films by organic molecular beam deposition onto an organic substrate. A large anisotropy can be detected by following the line shape evolution of the RAS spectrum; in addition, the signal variation at a fixed wavelength is used to monitor the film growth. The signal intensity scales with the deposited thickness, demonstrating a very high sensitivity of RAS to less than 1/50 of a monolayer. Evidence of the advantages of RAS to monitor in real time the growth of molecular films and to probe in situ their properties is therefore obtained. (C) 2003 American Institute of Physics
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