CHOUPAN, NEGAR
CHOUPAN, NEGAR
DIPARTIMENTO DI FISICA "GIUSEPPE OCCHIALINI"
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Characterization Procedure for Effective Evaluation of III-V Compound Semiconductor Technology
2025 Choupan, N; Vadala, V; Bosi, G; Ramella, C; Grassi, M; Crupi, G; Giofre, R; Raffo, A; Vannini, G
Development of a GaAs Stacked Cells Based on Common-Gate Model Extraction Procedure
2025 Choupan, N; Vadala, V; Bosi, G; Pirola, M; Ramella, C
| Titolo | Tipologia | Data di pubblicazione | Autori | File |
|---|---|---|---|---|
| Characterization Procedure for Effective Evaluation of III-V Compound Semiconductor Technology | 02 - Intervento a convegno | 2025 | Choupan N.Vadala V.Bosi G. + | |
| Development of a GaAs Stacked Cells Based on Common-Gate Model Extraction Procedure | 02 - Intervento a convegno | 2025 | Choupan N.Vadala V.Bosi G. + |