In this paper a new methodology to characterize the breakdown of microwave electron devices under realistic device operation is described. Different experimental examples will be provided in order to demonstrate the validity of the proposed characterization technique with respect to the ones commonly adopted.
Raffo, A., Di Falco, S., Vadalà, V., Vannini, G. (2010). Characterization of Electron Device Breakdown Under Nonlinear Dynamic Operation. In European Microwave Week 2010: Connecting the World, EuMIC 2010 - Conference Proceedings (pp.130-133). EuMA.
Characterization of Electron Device Breakdown Under Nonlinear Dynamic Operation
Vadalà, V;
2010
Abstract
In this paper a new methodology to characterize the breakdown of microwave electron devices under realistic device operation is described. Different experimental examples will be provided in order to demonstrate the validity of the proposed characterization technique with respect to the ones commonly adopted.
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