The cubic polytype of SiC (3C-SiC) is the only one that can be grown on silicon substrate with the thickness required for targeted applications. However, the crystalline quality of 3C-SiC on silicon has to be improved in order to benefit from the intrinsic 3C-SiC properties. In this project new approaches for the reduction of defects will be used and new compliance substrates that can help to reduce the stress and the defect density at the same time will be explored. Numerical simulations will be applied to optimize growth conditions and reduce stress in the material. The structure of the final devices will be simulated using the appropriated numerical tools where new numerical model will be introduced to take into account the properties of the new material. Thanks to these simulations tools and the new material with low defect density, several devices that can work at high power and with low power consumption will be realized within the project.

La Via, F., Roccaforte, F., La Magna, A., Nipoti, R., Mancarella, F., Wellman, P., et al. (2018). 3C-SiC hetero-epitaxially grown on silicon compliance substrates and new 3C-SiC substrates for sustainable wide-band-gap power devices (CHALLENGE). Intervento presentato a: International Conference on Silicon Carbide and Related Materials, ICSCRM 2017, usa [10.4028/www.scientific.net/MSF.924.913].

3C-SiC hetero-epitaxially grown on silicon compliance substrates and new 3C-SiC substrates for sustainable wide-band-gap power devices (CHALLENGE)

Miglio L.;
2018

Abstract

The cubic polytype of SiC (3C-SiC) is the only one that can be grown on silicon substrate with the thickness required for targeted applications. However, the crystalline quality of 3C-SiC on silicon has to be improved in order to benefit from the intrinsic 3C-SiC properties. In this project new approaches for the reduction of defects will be used and new compliance substrates that can help to reduce the stress and the defect density at the same time will be explored. Numerical simulations will be applied to optimize growth conditions and reduce stress in the material. The structure of the final devices will be simulated using the appropriated numerical tools where new numerical model will be introduced to take into account the properties of the new material. Thanks to these simulations tools and the new material with low defect density, several devices that can work at high power and with low power consumption will be realized within the project.
paper
3C-SiC; CVD growth; Power devices; PVT growth
English
International Conference on Silicon Carbide and Related Materials, ICSCRM 2017
2017
9783035711455
2018
924
913
918
open
La Via, F., Roccaforte, F., La Magna, A., Nipoti, R., Mancarella, F., Wellman, P., et al. (2018). 3C-SiC hetero-epitaxially grown on silicon compliance substrates and new 3C-SiC substrates for sustainable wide-band-gap power devices (CHALLENGE). Intervento presentato a: International Conference on Silicon Carbide and Related Materials, ICSCRM 2017, usa [10.4028/www.scientific.net/MSF.924.913].
File in questo prodotto:
File Dimensione Formato  
10281-272635.pdf

accesso aperto

Tipologia di allegato: Publisher’s Version (Version of Record, VoR)
Dimensione 757.94 kB
Formato Adobe PDF
757.94 kB Adobe PDF Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/272635
Citazioni
  • Scopus 14
  • ???jsp.display-item.citation.isi??? ND
Social impact