The morphology of C54-TiSi2 polycrystalline films has been revealed by the micro-Raman imaging technique. This was based on the calculation of the symmetries of the Raman active vibrations of the C54-TiSi2 single crystal and subsequent polarized Raman measurements to detect and unambiguously label all the expected peaks. The relative intensity of two suitable peaks was monitored and mapped on C54-TiSi2 blanket films. Grains with different orientation are clearly detectable, and the microstructure properties of the film can be analyzed. (C) 1999 American Institute of Physics. [S0003-6951(99)01746-5].
Meinardi, F., Quilici, S., Borghesi, A., Artioli, G. (1999). Microstructure imaging of C54-TiSi2 polycrystalline thin films by micro-Raman spectroscopy. APPLIED PHYSICS LETTERS, 75(20), 3090-3092 [10.1063/1.125240].
Microstructure imaging of C54-TiSi2 polycrystalline thin films by micro-Raman spectroscopy
MEINARDI, FRANCESCO;BORGHESI, ALESSANDRO;
1999
Abstract
The morphology of C54-TiSi2 polycrystalline films has been revealed by the micro-Raman imaging technique. This was based on the calculation of the symmetries of the Raman active vibrations of the C54-TiSi2 single crystal and subsequent polarized Raman measurements to detect and unambiguously label all the expected peaks. The relative intensity of two suitable peaks was monitored and mapped on C54-TiSi2 blanket films. Grains with different orientation are clearly detectable, and the microstructure properties of the film can be analyzed. (C) 1999 American Institute of Physics. [S0003-6951(99)01746-5].
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