ZnS is a versatile, abundant and eco-friendly semiconductor material employed in many applications. In the present manuscript, ZnS thin films were grown by one of the most simple and scalable vacuum method, that is the room temperature radio frequency sputtering technique. An extensive characterization has been performed by atomic force microscopy, X-ray diffraction, absorption and photoluminescence spectroscopies to identify the growth conditions required to obtain compact and low- defective ZnS layers, as required in many applications. Optimized thin films consist of nanocrystalline ZnS with very low surface roughness with respect to the literature, which make them particularly suitable for optical interfacing and alternative buffer layer in chalcogenide thin film solar cells

LE DONNE, A., Cavalcoli, D., Mereu, R., Perani, M., Pagani, L., Acciarri, M., et al. (2017). Study of the physical properties of ZnS thin films deposited by RF sputtering. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 71, 7-11 [10.1016/j.mssp.2017.06.042].

Study of the physical properties of ZnS thin films deposited by RF sputtering

LE DONNE, ALESSIA
Primo
;
MEREU, RALUCA ANCA;ACCIARRI, MAURIZIO FILIPPO
Penultimo
;
BINETTI, SIMONA OLGA
Ultimo
2017

Abstract

ZnS is a versatile, abundant and eco-friendly semiconductor material employed in many applications. In the present manuscript, ZnS thin films were grown by one of the most simple and scalable vacuum method, that is the room temperature radio frequency sputtering technique. An extensive characterization has been performed by atomic force microscopy, X-ray diffraction, absorption and photoluminescence spectroscopies to identify the growth conditions required to obtain compact and low- defective ZnS layers, as required in many applications. Optimized thin films consist of nanocrystalline ZnS with very low surface roughness with respect to the literature, which make them particularly suitable for optical interfacing and alternative buffer layer in chalcogenide thin film solar cells
Articolo in rivista - Articolo scientifico
Atomic force microscopy Nanocrystals Photoluminescence spectroscopy Surface roughness Thin film solar cells X ray diffraction Zinc sulfide
English
2017
7
11
5
LE DONNE, A., Cavalcoli, D., Mereu, R., Perani, M., Pagani, L., Acciarri, M., et al. (2017). Study of the physical properties of ZnS thin films deposited by RF sputtering. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 71, 7-11 [10.1016/j.mssp.2017.06.042].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/161119
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