Quantum dot infrared detectors can be integrated on silicon using droplet epitaxy, enabling the simultaneous detection of multiple wavelengths in a format compatible with current semiconductor technology.
Frigerio, J., Isella, G., Bietti, S., Sanguinetti, S. (2013). Multispectral imaging sensors integrated on silicon. SPIE NEWSROOM [10.1117/2.1201307.004861].
Multispectral imaging sensors integrated on silicon
BIETTI, SERGIOPenultimo
;SANGUINETTI, STEFANOUltimo
2013
Abstract
Quantum dot infrared detectors can be integrated on silicon using droplet epitaxy, enabling the simultaneous detection of multiple wavelengths in a format compatible with current semiconductor technology.
File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
004861_10.pdf
Solo gestori archivio
Dimensione
762.57 kB
Formato
Adobe PDF
|
762.57 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
