We show here what kind of modification of the interphase morphology of SnO2 nanoparticles in silica (average nanocrystal radius, r=4nm in undoped material; r=2 nm in erbium doped material) brings to the passivation of interfacial defects. Surface states, which may preclude the exploitation of UV excitonic emission, are reduced after doping by rare earth ions. We demonstrate, by means of transmission-electron-microscopy and small-angleneutron-scattering data, that a smooth interphase with a non negligible thickness takes the place of the fractal and discontinuous boundary observed in undoped material
Brovelli, S., Chiodini, N., Lauria, A., & Paleari, A. (2008). Erbium-induced blurring of the fractal surface of SnO2 nanocrystals grown in silica. JOURNAL OF NANOPARTICLE RESEARCH, 10(5), 737-743.
Citazione: | Brovelli, S., Chiodini, N., Lauria, A., & Paleari, A. (2008). Erbium-induced blurring of the fractal surface of SnO2 nanocrystals grown in silica. JOURNAL OF NANOPARTICLE RESEARCH, 10(5), 737-743. |
Tipo: | Articolo in rivista - Articolo scientifico |
Carattere della pubblicazione: | Scientifica |
Titolo: | Erbium-induced blurring of the fractal surface of SnO2 nanocrystals grown in silica |
Autori: | Brovelli, S; Chiodini, N; Lauria, A; Paleari, A |
Autori: | |
Data di pubblicazione: | 2008 |
Lingua: | English |
Rivista: | JOURNAL OF NANOPARTICLE RESEARCH |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1007/s11051-007-9302-y |
Appare nelle tipologie: | 01 - Articolo su rivista |