We show here what kind of modification of the interphase morphology of SnO2 nanoparticles in silica (average nanocrystal radius, r=4nm in undoped material; r=2 nm in erbium doped material) brings to the passivation of interfacial defects. Surface states, which may preclude the exploitation of UV excitonic emission, are reduced after doping by rare earth ions. We demonstrate, by means of transmission-electron-microscopy and small-angleneutron-scattering data, that a smooth interphase with a non negligible thickness takes the place of the fractal and discontinuous boundary observed in undoped material
Brovelli, S., Chiodini, N., Lauria, A., Paleari, A. (2008). Erbium-induced blurring of the fractal surface of SnO2 nanocrystals grown in silica. JOURNAL OF NANOPARTICLE RESEARCH, 10(5), 737-743 [10.1007/s11051-007-9302-y].
Erbium-induced blurring of the fractal surface of SnO2 nanocrystals grown in silica
BROVELLI, SERGIO;CHIODINI, NORBERTO;LAURIA, ALESSANDRO;PALEARI, ALBERTO MARIA FELICE
2008
Abstract
We show here what kind of modification of the interphase morphology of SnO2 nanoparticles in silica (average nanocrystal radius, r=4nm in undoped material; r=2 nm in erbium doped material) brings to the passivation of interfacial defects. Surface states, which may preclude the exploitation of UV excitonic emission, are reduced after doping by rare earth ions. We demonstrate, by means of transmission-electron-microscopy and small-angleneutron-scattering data, that a smooth interphase with a non negligible thickness takes the place of the fractal and discontinuous boundary observed in undoped material
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