The reflection coefficient determining the inelastic scattered intensity is defined and analysed theoretically. Various approximations including the Born approximation, the Distorted-Wave Born approximation (DWBA), the GR method and the eikonal approximation are discussed and illustrated with examples. From an expression for the DWBA inelastic reflection coefficient for n-phonon processes, factors determining the relative role of temperature for multiphonon processes and one-phonon scattering are analysed. Several approximate expressions for the Debye-Waller factor are derived and used to define experimental criteria favouring one-phonon scattering. Most of the examples dealt with are for insulator surfaces. Chapter 8 then describes the scattering theory for metal and semiconductor surfaces.
Benedek, G., Toennies, J. (2018). Theory of atom scattering from surface phonons: Basic concepts and temperature effects. In Atomic Scale Dynamics at Surfaces Theory and Experimental Studies with Helium Atom Scattering (pp. 181-226). Springer Verlag [10.1007/978-3-662-56443-1_7].
Theory of atom scattering from surface phonons: Basic concepts and temperature effects
Benedek G.;
2018
Abstract
The reflection coefficient determining the inelastic scattered intensity is defined and analysed theoretically. Various approximations including the Born approximation, the Distorted-Wave Born approximation (DWBA), the GR method and the eikonal approximation are discussed and illustrated with examples. From an expression for the DWBA inelastic reflection coefficient for n-phonon processes, factors determining the relative role of temperature for multiphonon processes and one-phonon scattering are analysed. Several approximate expressions for the Debye-Waller factor are derived and used to define experimental criteria favouring one-phonon scattering. Most of the examples dealt with are for insulator surfaces. Chapter 8 then describes the scattering theory for metal and semiconductor surfaces.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.


