Polycrystalline samples and thin films of the x = 0.8 member of the Ce xGd1-xO2-y solid solution have been successfully prepared. Their structural and transport properties have been studied by means of X-ray diffraction and electrical conductivity measurements as a function of preparation route, grain size, substrate nature and film thickness. Our data shows that the substrate roughness plays a relevant role in affecting the final σ; however, by optimizing the thin films preparation conditions we showed that the conductivity of CGO material is always greater than that of the state-of-the-art oxide conductor, the YSZ 8 mol%, even though an electronic contribution ranging from 10% to 20% was found.
Chiodelli, G., Malavasi, L., Massarotti, V., Mustarelli, P., Quartarone, E. (2005). Synthesis and characterization of Ce0.8Gd0.2O2-y polycrystalline and thin film materials. SOLID STATE IONICS, 176(17-18), 1505-1512 [10.1016/j.ssi.2005.03.017].
Synthesis and characterization of Ce0.8Gd0.2O2-y polycrystalline and thin film materials
Mustarelli Piercarlo;
2005
Abstract
Polycrystalline samples and thin films of the x = 0.8 member of the Ce xGd1-xO2-y solid solution have been successfully prepared. Their structural and transport properties have been studied by means of X-ray diffraction and electrical conductivity measurements as a function of preparation route, grain size, substrate nature and film thickness. Our data shows that the substrate roughness plays a relevant role in affecting the final σ; however, by optimizing the thin films preparation conditions we showed that the conductivity of CGO material is always greater than that of the state-of-the-art oxide conductor, the YSZ 8 mol%, even though an electronic contribution ranging from 10% to 20% was found.| File | Dimensione | Formato | |
|---|---|---|---|
|
Chiodelli et al-2005-Solid State Ionics-VoR.pdf
Solo gestori archivio
Tipologia di allegato:
Publisher’s Version (Version of Record, VoR)
Licenza:
Tutti i diritti riservati
Dimensione
363.88 kB
Formato
Adobe PDF
|
363.88 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.


