We measured the heavy ion-induced single-event effect (SEE) susceptibility of the LTC1668 DAC from Linear Technology, to be used in the LiteBIRD JAXA space mission. LiteBIRD will be operated from the Lagrangian L2 in the early 30s, to map the microwave sky with three telescopes equipped with 4800 Transition Edge Sensors (TES) distributed onto three focal planes. The DAC we investigate here is a key item of the detector readout chain since it generates the MHz bias signal that is required by the TES Frequency-Division Multiplexing scheme. This 16 -bit/50 Msps DAC has been identified as a critical element by its output spectral purity and low-power consumption (180 mW), which allow us to fulfil LiteBIRD's power budget constraints. Since this device doesn't exist in a space-qualified version, we have carried out a first characterization campaign at the heavy-ion facility Tandem-ALPI at INFN Legnaro National Laboratory (Italy) for a total irradiation time of 51 hours, to investigate its susceptibility to SEE. We have exposed the device to a beam of different ions with LET values ranging from 12 to 90 MeV cm-2 mg-1. The device is moderately sensitive to SEE, with a threshold LET of 10.3 ± 1.3 MeV cm2 mg-1 for SEU, 7.6 ± 2.0 MeV cm mg-1 for SEL, and 9.2 ± 1.95 MeV cm2 mg-1 for SET. This first campaign suggests that the use of DAC LTC1668 from space can be seriously considered.

Cotta Ramusino, A., Della Torre, S., Galli, L., Limonta, A., Malaguti, R., Nicolo, D., et al. (2024). Heavy-Ion Radiation Test on LTC1668 DAC. In 2024 RADECS Data Workshop (pp.1-8). Institute of Electrical and Electronics Engineers Inc. [10.1109/RADECS61975.2024.11017543].

Heavy-Ion Radiation Test on LTC1668 DAC

Limonta A.;Zannoni M.
2024

Abstract

We measured the heavy ion-induced single-event effect (SEE) susceptibility of the LTC1668 DAC from Linear Technology, to be used in the LiteBIRD JAXA space mission. LiteBIRD will be operated from the Lagrangian L2 in the early 30s, to map the microwave sky with three telescopes equipped with 4800 Transition Edge Sensors (TES) distributed onto three focal planes. The DAC we investigate here is a key item of the detector readout chain since it generates the MHz bias signal that is required by the TES Frequency-Division Multiplexing scheme. This 16 -bit/50 Msps DAC has been identified as a critical element by its output spectral purity and low-power consumption (180 mW), which allow us to fulfil LiteBIRD's power budget constraints. Since this device doesn't exist in a space-qualified version, we have carried out a first characterization campaign at the heavy-ion facility Tandem-ALPI at INFN Legnaro National Laboratory (Italy) for a total irradiation time of 51 hours, to investigate its susceptibility to SEE. We have exposed the device to a beam of different ions with LET values ranging from 12 to 90 MeV cm-2 mg-1. The device is moderately sensitive to SEE, with a threshold LET of 10.3 ± 1.3 MeV cm2 mg-1 for SEU, 7.6 ± 2.0 MeV cm mg-1 for SEL, and 9.2 ± 1.95 MeV cm2 mg-1 for SET. This first campaign suggests that the use of DAC LTC1668 from space can be seriously considered.
poster + paper
CMOS integrated circuits; Ion radiation effects; Radiation hardening (electronics); Single event latch-up; Space technology;
English
2024 RADECS Data Workshop, RADECS 2024 in conjunction with the 2024 RADECS Conference - 19-19 September 2024
2024
2024 RADECS Data Workshop
9798331536312
2024
1
8
reserved
Cotta Ramusino, A., Della Torre, S., Galli, L., Limonta, A., Malaguti, R., Nicolo, D., et al. (2024). Heavy-Ion Radiation Test on LTC1668 DAC. In 2024 RADECS Data Workshop (pp.1-8). Institute of Electrical and Electronics Engineers Inc. [10.1109/RADECS61975.2024.11017543].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/560461
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