In this work, we characterize the performance of a deep convolutional neural network designed to detect and quantify chemical elements in experimental x-ray photoelectron spectroscopy data. Given the lack of a reliable database in literature, in order to train the neural network we computed a large (<100 k) dataset of synthetic spectra, based on randomly generated materials covered with a layer of adventitious carbon. The trained net performs as well as standard methods on a test set of~500 well characterized experimental x-ray photoelectron spectra. Fine details about the net layout, the choice of the loss function and the quality assessment strategies are presented and discussed. Given the synthetic nature of the training set, this approach could be applied to the automatization of any photoelectron spectroscopy system, without the need of experimental reference spectra and with a low computational effort.

Drera, G., Kropf, C., Sangaletti, L. (2020). Deep neural network for x-ray photoelectron spectroscopy data analysis. MACHINE LEARNING: SCIENCE AND TECHNOLOGY, 1(1) [10.1088/2632-2153/ab5da6].

Deep neural network for x-ray photoelectron spectroscopy data analysis

Drera G
;
2020

Abstract

In this work, we characterize the performance of a deep convolutional neural network designed to detect and quantify chemical elements in experimental x-ray photoelectron spectroscopy data. Given the lack of a reliable database in literature, in order to train the neural network we computed a large (<100 k) dataset of synthetic spectra, based on randomly generated materials covered with a layer of adventitious carbon. The trained net performs as well as standard methods on a test set of~500 well characterized experimental x-ray photoelectron spectra. Fine details about the net layout, the choice of the loss function and the quality assessment strategies are presented and discussed. Given the synthetic nature of the training set, this approach could be applied to the automatization of any photoelectron spectroscopy system, without the need of experimental reference spectra and with a low computational effort.
Articolo in rivista - Articolo scientifico
Deep convolutional neural networks; Photoelectron spectroscopy; XPS;
English
2020
1
1
015008
none
Drera, G., Kropf, C., Sangaletti, L. (2020). Deep neural network for x-ray photoelectron spectroscopy data analysis. MACHINE LEARNING: SCIENCE AND TECHNOLOGY, 1(1) [10.1088/2632-2153/ab5da6].
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/517421
Citazioni
  • Scopus 17
  • ???jsp.display-item.citation.isi??? 18
Social impact