The structure of self-assembled quantum dots (QDs) grown by Droplet Epitaxy on Ge virtual substrates has been investigated by TEM. The QDs have a pyramidal shape with base and height of 50 nm. By (0 0 2) dark field TEM it was seen that the pyramid top is Ga poor and Al rich most likely because of the higher mobility of Ga along the pyramid sides down to the base. The investigated QDs contain defects identified as As precipitates by Moirè fringes. The smallest ones (3-5 nm) are coherent with the GaAs lattice suggesting that they could be a cubic phase of As precipitation. It seems to be a metastable phase since the hexagonal phase is recovered as the precipitate size increases above ∼5 nm. © 2012 Elsevier B.V. All rights reserved.

Frigeri, C., Bietti, S., Isella, G., Sanguinetti, S. (2013). Structural characterization of GaAs self-assembled quantum dots grown by Droplet Epitaxy on Ge virtual substrates on Si. APPLIED SURFACE SCIENCE, 267, 86-89 [10.1016/j.apsusc.2012.07.154].

Structural characterization of GaAs self-assembled quantum dots grown by Droplet Epitaxy on Ge virtual substrates on Si

BIETTI, SERGIO;SANGUINETTI, STEFANO
2013

Abstract

The structure of self-assembled quantum dots (QDs) grown by Droplet Epitaxy on Ge virtual substrates has been investigated by TEM. The QDs have a pyramidal shape with base and height of 50 nm. By (0 0 2) dark field TEM it was seen that the pyramid top is Ga poor and Al rich most likely because of the higher mobility of Ga along the pyramid sides down to the base. The investigated QDs contain defects identified as As precipitates by Moirè fringes. The smallest ones (3-5 nm) are coherent with the GaAs lattice suggesting that they could be a cubic phase of As precipitation. It seems to be a metastable phase since the hexagonal phase is recovered as the precipitate size increases above ∼5 nm. © 2012 Elsevier B.V. All rights reserved.
Articolo in rivista - Articolo scientifico
quantum dots, droplet epitaxy, integration III-V on Si
English
2013
267
86
89
none
Frigeri, C., Bietti, S., Isella, G., Sanguinetti, S. (2013). Structural characterization of GaAs self-assembled quantum dots grown by Droplet Epitaxy on Ge virtual substrates on Si. APPLIED SURFACE SCIENCE, 267, 86-89 [10.1016/j.apsusc.2012.07.154].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/49213
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