A calibration circuit for single-ramp A-to-D converters is presented here. The calibration circuit allows to automatically compensate the process/mismatch and radiation effects on the A-to-D converter, improving performance and Equivalent Number of Bits. In particular, the calibration circuit is able to automatically align the ramp signal reference used for the conversion in single slope architectures A-to-D architectures, compensating slope deviations due to technological/electrical reasons. Moreover, the calibration circuit shares the same analog circuits of the A-to-D converter, requiring only a small additional power budget and logic for the implementation. The calibration circuit has been validated, testing the overall A-to-D converter after the calibration. A 12 steps binary search is required to calibrate the A-to-D converter (about 2.5ms). This calibration circuit is able to guarantee an 11bits accuracy, in the worst case simulation corner. The technology used is a 65 nm CMOS. The clock frequency has been set to 20 MHz and the power consumption is about 400 μW. © 2013 IEEE.

Vergine, T., DE MATTEIS, M., Rota, L., Marchioro, A., Baschirotto, A. (2013). An automatic calibration circuit for 12-bits single-ramp A-to-D converter in LHC environments. In Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) (pp.45-48) [10.1109/PRIME.2013.6603108].

An automatic calibration circuit for 12-bits single-ramp A-to-D converter in LHC environments

DE MATTEIS, MARCELLO;Rota, L;BASCHIROTTO, ANDREA
2013

Abstract

A calibration circuit for single-ramp A-to-D converters is presented here. The calibration circuit allows to automatically compensate the process/mismatch and radiation effects on the A-to-D converter, improving performance and Equivalent Number of Bits. In particular, the calibration circuit is able to automatically align the ramp signal reference used for the conversion in single slope architectures A-to-D architectures, compensating slope deviations due to technological/electrical reasons. Moreover, the calibration circuit shares the same analog circuits of the A-to-D converter, requiring only a small additional power budget and logic for the implementation. The calibration circuit has been validated, testing the overall A-to-D converter after the calibration. A 12 steps binary search is required to calibrate the A-to-D converter (about 2.5ms). This calibration circuit is able to guarantee an 11bits accuracy, in the worst case simulation corner. The technology used is a 65 nm CMOS. The clock frequency has been set to 20 MHz and the power consumption is about 400 μW. © 2013 IEEE.
paper
ADC
English
9th Conference on Ph. D. Research in Microelectronics and Electronics, PRIME 2013
2013
Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)
978-1-4673-4580-4
2013
45
48
none
Vergine, T., DE MATTEIS, M., Rota, L., Marchioro, A., Baschirotto, A. (2013). An automatic calibration circuit for 12-bits single-ramp A-to-D converter in LHC environments. In Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) (pp.45-48) [10.1109/PRIME.2013.6603108].
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/48594
Citazioni
  • Scopus 5
  • ???jsp.display-item.citation.isi??? 5
Social impact