Certifying the data recorded by the Compact Muon Solenoid (CMS) experiment at CERN is a crucial and demanding task as the data is used for publication of physics results. Anomalies caused by detector malfunctioning or sub-optimal data processing are difficult to enumerate a priori and occur rarely, making it difficult to use classical supervised classification. We base out prototype towards the automation of such procedure on a semi-supervised approach using deep autoencoders. We demonstrate the ability of the model to detect anomalies with high accuracy, when compared against the outcome of the fully supervised methods. We show that the model has great interpretability of the results, ascribing the origin of the problems in the data to a specific sub-detector or physics object. Finally, we address the issue of feature dependency on the LHC beam intensity.

Pol, A., Azzolini, V., Cerminara, G., de Guio, F., Franzoni, G., Germain, C., et al. (2020). Deep learning for certification of the quality of the data acquired by the CMS Experiment. JOURNAL OF PHYSICS. CONFERENCE SERIES, 1525(1) [10.1088/1742-6596/1525/1/012045].

Deep learning for certification of the quality of the data acquired by the CMS Experiment

de Guio, F;
2020

Abstract

Certifying the data recorded by the Compact Muon Solenoid (CMS) experiment at CERN is a crucial and demanding task as the data is used for publication of physics results. Anomalies caused by detector malfunctioning or sub-optimal data processing are difficult to enumerate a priori and occur rarely, making it difficult to use classical supervised classification. We base out prototype towards the automation of such procedure on a semi-supervised approach using deep autoencoders. We demonstrate the ability of the model to detect anomalies with high accuracy, when compared against the outcome of the fully supervised methods. We show that the model has great interpretability of the results, ascribing the origin of the problems in the data to a specific sub-detector or physics object. Finally, we address the issue of feature dependency on the LHC beam intensity.
Articolo in rivista - Articolo scientifico
Data handling; Deep learning; Object detection; Supervised learning
English
2020
1525
1
012045
none
Pol, A., Azzolini, V., Cerminara, G., de Guio, F., Franzoni, G., Germain, C., et al. (2020). Deep learning for certification of the quality of the data acquired by the CMS Experiment. JOURNAL OF PHYSICS. CONFERENCE SERIES, 1525(1) [10.1088/1742-6596/1525/1/012045].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/477679
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