This paper presents a new approach for patterning Josephson junctions using a UV lithography process with direct laser writing and image reversal resist. The fabricated junctions with A1/AlOx/A1 on Si substrates achieved a resolution close to 0.8 μ m and an aspect ratio near to 1: 1, which is crucial for optimal performance as a switch in quantum bits. Compared to conventional Electron Beam Lithography (EBL), this method offers cost-effectiveness and high reproducibility. The junctions' quality was characterized using normal state resistance measurements with a 4-terminal probe and current sweeps. Our results demonstrate the potential of this new technique for achieving high-quality Josephson junctions for use in advanced applications such as quantum computing and superconductivity research.

Verna, A., Fasolo, L., Zannoni, M., Giachero, A., Labranca, D., Origo, L., et al. (2023). A Promising Alternative to Conventional EBL: UV Lithography with Direct Laser Writing for Josephson Junction Patterning. In 2023 IEEE Nanotechnology Materials and Devices Conference, NMDC 2023 (pp.480-481). Institute of Electrical and Electronics Engineers Inc. [10.1109/NMDC57951.2023.10343589].

A Promising Alternative to Conventional EBL: UV Lithography with Direct Laser Writing for Josephson Junction Patterning

Zannoni M.;Giachero A.;Labranca D.;Origo L.;Faverzani M.;Moretti R.;
2023

Abstract

This paper presents a new approach for patterning Josephson junctions using a UV lithography process with direct laser writing and image reversal resist. The fabricated junctions with A1/AlOx/A1 on Si substrates achieved a resolution close to 0.8 μ m and an aspect ratio near to 1: 1, which is crucial for optimal performance as a switch in quantum bits. Compared to conventional Electron Beam Lithography (EBL), this method offers cost-effectiveness and high reproducibility. The junctions' quality was characterized using normal state resistance measurements with a 4-terminal probe and current sweeps. Our results demonstrate the potential of this new technique for achieving high-quality Josephson junctions for use in advanced applications such as quantum computing and superconductivity research.
slide + paper
Quantum computing, Semiconductor lasers, Lithography, Measurement by laser beam, Superconductivity, Resists, Writing
English
18th IEEE Nanotechnology Materials and Devices Conference, NMDC 2023 - 22 October 2023 through 25 October 202
2023
2023 IEEE Nanotechnology Materials and Devices Conference, NMDC 2023
9798350335460
2023
480
481
none
Verna, A., Fasolo, L., Zannoni, M., Giachero, A., Labranca, D., Origo, L., et al. (2023). A Promising Alternative to Conventional EBL: UV Lithography with Direct Laser Writing for Josephson Junction Patterning. In 2023 IEEE Nanotechnology Materials and Devices Conference, NMDC 2023 (pp.480-481). Institute of Electrical and Electronics Engineers Inc. [10.1109/NMDC57951.2023.10343589].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/458558
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