Entanglement and correlation are at the basis of quantum mechanics and have been used in optics to create a framework for “ghost imaging”. We propose that a similar scheme can be used in an electron microscope to exploit the correlation of electrons with the coincident detection of collective mode excitations in a sample. In this way, an image of the sample can be formed on an electron camera even if electrons never illuminated the region of interest directly. This concept, which can be regarded as the inverse of photon-induced near-field electron microscopy, can be used to probe delicate molecules with a resolution that is beyond the wavelength of the collective mode.

Rotunno, E., Gargiulo, S., Vanacore, G., Mechel, C., Tavabi, A., Dunin-Borkowski, R., et al. (2023). One-Dimensional “Ghost Imaging” in Electron Microscopy of Inelastically Scattered Electrons. ACS PHOTONICS, 10(6), 1708-1715 [10.1021/acsphotonics.2c01925].

One-Dimensional “Ghost Imaging” in Electron Microscopy of Inelastically Scattered Electrons

Vanacore G. M.;
2023

Abstract

Entanglement and correlation are at the basis of quantum mechanics and have been used in optics to create a framework for “ghost imaging”. We propose that a similar scheme can be used in an electron microscope to exploit the correlation of electrons with the coincident detection of collective mode excitations in a sample. In this way, an image of the sample can be formed on an electron camera even if electrons never illuminated the region of interest directly. This concept, which can be regarded as the inverse of photon-induced near-field electron microscopy, can be used to probe delicate molecules with a resolution that is beyond the wavelength of the collective mode.
Articolo in rivista - Articolo scientifico
electron beam shaping; electron microscopy; electron-light entanglement; electron−light interaction; ultrafast dynamics;
English
2023
10
6
1708
1715
open
Rotunno, E., Gargiulo, S., Vanacore, G., Mechel, C., Tavabi, A., Dunin-Borkowski, R., et al. (2023). One-Dimensional “Ghost Imaging” in Electron Microscopy of Inelastically Scattered Electrons. ACS PHOTONICS, 10(6), 1708-1715 [10.1021/acsphotonics.2c01925].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/451558
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