In this paper we report the cohesion energy curves for different CoSi2 structures calculated by a semiempirical tight binding scheme. We set up a stability hierarchy among them and provide a kinetic model which could explain very recent and apparently contradictory Molecular Beam Epitaxy findings concerning the stability of a new pseudomorphic phase, i.e. the defected CsCl

Miglio, L., Tavazza, F. (1996). Stability hierarchy of new epitaxial phases in CoSi 2. In SILICIDE THIN FILMS - FABRICATION, PROPERTIES, AND APPLICATIONS (pp.33-38). Pittsburgh : Cambridge University Press [10.1557/PROC-402-33].

Stability hierarchy of new epitaxial phases in CoSi 2

MIGLIO, LEONIDA;
1996

Abstract

In this paper we report the cohesion energy curves for different CoSi2 structures calculated by a semiempirical tight binding scheme. We set up a stability hierarchy among them and provide a kinetic model which could explain very recent and apparently contradictory Molecular Beam Epitaxy findings concerning the stability of a new pseudomorphic phase, i.e. the defected CsCl
paper
CoSi phases
English
Symposium on Silicide Thin Films - Fabrication, Properties, and Applications, at the 1995 MRS Fall Meeting NOV 27-30
1995
Tung, RT; Maex, K; Pellegrini, PW; Allen LH
SILICIDE THIN FILMS - FABRICATION, PROPERTIES, AND APPLICATIONS
1-55899-305-3
1996
402
33
38
none
Miglio, L., Tavazza, F. (1996). Stability hierarchy of new epitaxial phases in CoSi 2. In SILICIDE THIN FILMS - FABRICATION, PROPERTIES, AND APPLICATIONS (pp.33-38). Pittsburgh : Cambridge University Press [10.1557/PROC-402-33].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/44118
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