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Boioli, F., Gatti, R., Devincre, B., Montalenti, F., Miglio, L. (2012). Misfit dislocation gettering in epitaxial films deposited on pit-patterned Si (001) substrates by dislocation dynamics simulations. Intervento presentato a: ESPS-NIS – International Workshop on Epitaxial Semiconductors on Patterned Substrates and Novel Index Surfaces, Eindhoven (The Netherlands).

Misfit dislocation gettering in epitaxial films deposited on pit-patterned Si (001) substrates by dislocation dynamics simulations

BOIOLI, FRANCESCA;MONTALENTI, FRANCESCO CIMBRO MATTIA;MIGLIO, LEONIDA
2012
abstract + slide
Dislocations; plasticity; Si; Ge
English
ESPS-NIS – International Workshop on Epitaxial Semiconductors on Patterned Substrates and Novel Index Surfaces
2012
mag-2012
none
Boioli, F., Gatti, R., Devincre, B., Montalenti, F., Miglio, L. (2012). Misfit dislocation gettering in epitaxial films deposited on pit-patterned Si (001) substrates by dislocation dynamics simulations. Intervento presentato a: ESPS-NIS – International Workshop on Epitaxial Semiconductors on Patterned Substrates and Novel Index Surfaces, Eindhoven (The Netherlands).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/43353
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