In Active Current Limiter for High-Side (HS) circuits adopted in Automotive applications stability is strongly affected by Short Circuit (SC) cases. Such several possible SC cases depend on the specific SC situations occurring in the system and, then, present different electrical conditions, for instance with inductive load from 0μH to 20μH. These SC events result in large load current step producing large current overshoot, which could damage the overall system. In this paper a simple and extremely efficient solution (namely the Split & Filter (S&F) technique) allows to limit the overshoot during transient response for all the SC events. The technique is applied to a 350 nm BCD implementation and experimentally demonstrates that for the most critical cases (i.e. with the lowest Phase-Margin) PM increases from 44° to 57° reducing overshoot from 61% to 30% and decreasing peak current value, from 38.7 A to 29.5 A, without overcompensating the less inductive short-circuit cases. Technique robustness is validated by extended simulations with PVT corners settings.
Grattacaso, F., Del Croce, P., Baschirotto, A. (2023). A 21kHz Phase Boost through Split & Filter Loop Stability Optimisation in Automotive Current Limitation. In PRIME 2023 - 18th International Conference on Ph.D Research in Microelectronics and Electronics, Proceedings (pp.41-44). Institute of Electrical and Electronics Engineers Inc. [10.1109/PRIME58259.2023.10161893].
A 21kHz Phase Boost through Split & Filter Loop Stability Optimisation in Automotive Current Limitation
Grattacaso, F
Primo
;Baschirotto, AUltimo
2023
Abstract
In Active Current Limiter for High-Side (HS) circuits adopted in Automotive applications stability is strongly affected by Short Circuit (SC) cases. Such several possible SC cases depend on the specific SC situations occurring in the system and, then, present different electrical conditions, for instance with inductive load from 0μH to 20μH. These SC events result in large load current step producing large current overshoot, which could damage the overall system. In this paper a simple and extremely efficient solution (namely the Split & Filter (S&F) technique) allows to limit the overshoot during transient response for all the SC events. The technique is applied to a 350 nm BCD implementation and experimentally demonstrates that for the most critical cases (i.e. with the lowest Phase-Margin) PM increases from 44° to 57° reducing overshoot from 61% to 30% and decreasing peak current value, from 38.7 A to 29.5 A, without overcompensating the less inductive short-circuit cases. Technique robustness is validated by extended simulations with PVT corners settings.
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