We present a dephasing time analysis of the excitonic resonances in Ge/SiGe quantum wells for various lattice temperatures by coherent oscillation spectroscopy (COS). The results are compared to the linewidths of the excitonic resonances determined from linear absorption measurements. Additionally, COS is applied to different samples with varying linewidth, identifying one sample with a dominating homogeneously broadened 1s excitonic resonance down to 7 K

Kolata, K., Köster, N., Chernikov, A., Drexler, M., Cecchi, S., Chrastina, D., et al. (2012). Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 86(20) [10.1103/PhysRevB.86.201303].

Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations

Cecchi, S;GUZZI, MARIO;GATTI, ELEONORA
2012

Abstract

We present a dephasing time analysis of the excitonic resonances in Ge/SiGe quantum wells for various lattice temperatures by coherent oscillation spectroscopy (COS). The results are compared to the linewidths of the excitonic resonances determined from linear absorption measurements. Additionally, COS is applied to different samples with varying linewidth, identifying one sample with a dominating homogeneously broadened 1s excitonic resonance down to 7 K
Articolo in rivista - Articolo scientifico
Semiconductors; quantum wells
English
30-nov-2012
2012
86
20
201303
none
Kolata, K., Köster, N., Chernikov, A., Drexler, M., Cecchi, S., Chrastina, D., et al. (2012). Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 86(20) [10.1103/PhysRevB.86.201303].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/42220
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