We identified the growth conditions which lead to the formation of a flat top facet in GaAs nanowires, grown by the self-assisted method in molecular beam epitaxy. Low arsenic overpressure, intermediate temperature and relatively long annealing time are needed to transform the Ga droplets present at the top of the nanowires into a flat GaAs segment. This result opens the possibility to realize atomically sharp heterointerfaces in this type of semiconductor nanowires.

Somaschini, C., Fedorov, A., Bietti, S., Scarpellini, D., Sanguinetti, S. (2018). Flat top formation in self-assisted GaAs nanowires. In 2015 1st Workshop on Nanotechnology in Instrumentation and Measurement, NANOFIM 2015 (pp.146-149). Institute of Electrical and Electronics Engineers Inc. [10.1109/NANOFIM.2015.8425276].

Flat top formation in self-assisted GaAs nanowires

Somaschini C.
Primo
;
Bietti S.;Scarpellini D.;Sanguinetti S.
2018

Abstract

We identified the growth conditions which lead to the formation of a flat top facet in GaAs nanowires, grown by the self-assisted method in molecular beam epitaxy. Low arsenic overpressure, intermediate temperature and relatively long annealing time are needed to transform the Ga droplets present at the top of the nanowires into a flat GaAs segment. This result opens the possibility to realize atomically sharp heterointerfaces in this type of semiconductor nanowires.
abstract + poster
GaAs; heterostructure; nanowires; RHEED; self-assisted;
English
1st Workshop on Nanotechnology in Instrumentation and Measurement, NANOFIM 2015 - 24 July 2015 through 25 July 2015
2015
2015 1st Workshop on Nanotechnology in Instrumentation and Measurement, NANOFIM 2015
9781509051519
2018
146
149
8425276
none
Somaschini, C., Fedorov, A., Bietti, S., Scarpellini, D., Sanguinetti, S. (2018). Flat top formation in self-assisted GaAs nanowires. In 2015 1st Workshop on Nanotechnology in Instrumentation and Measurement, NANOFIM 2015 (pp.146-149). Institute of Electrical and Electronics Engineers Inc. [10.1109/NANOFIM.2015.8425276].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/422018
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