Printer characterization usually requires many printer inputs and corresponding color measurements of the printed outputs. In this brief, a sampling optimization for printer characterization on the basis of direct search is proposed to maintain high color accuracy with a reduction in the number of characterization samples required. The proposed method is able to match a given level of color accuracy requiring, on average, a characterization set cardinality which is almost one-fourth of that required by the uniform sampling, while the best method in the state of the art needs almost one-third. The number of characterization samples required can be further reduced if the proposed algorithm is coupled with a sequential optimization method that refines the sample values in the device-independent color space. The proposed sampling optimization method is extended to deal with multiple substrates simultaneously, giving statistically better colorimetric accuracy (at the α=0.05 significance level) than sampling optimization techniques in the state of the art optimized for each individual substrate, thus allowing use of a single set of characterization samples for multiple substrates. © 1992-2012 IEEE.
Bianco, S., Schettini, R. (2012). Sampling Optimization for Printer Characterization by Direct Search. IEEE TRANSACTIONS ON IMAGE PROCESSING, 21(12), 4868-4873 [10.1109/TIP.2012.2211029].
Sampling Optimization for Printer Characterization by Direct Search
BIANCO, SIMONE;SCHETTINI, RAIMONDO
2012
Abstract
Printer characterization usually requires many printer inputs and corresponding color measurements of the printed outputs. In this brief, a sampling optimization for printer characterization on the basis of direct search is proposed to maintain high color accuracy with a reduction in the number of characterization samples required. The proposed method is able to match a given level of color accuracy requiring, on average, a characterization set cardinality which is almost one-fourth of that required by the uniform sampling, while the best method in the state of the art needs almost one-third. The number of characterization samples required can be further reduced if the proposed algorithm is coupled with a sequential optimization method that refines the sample values in the device-independent color space. The proposed sampling optimization method is extended to deal with multiple substrates simultaneously, giving statistically better colorimetric accuracy (at the α=0.05 significance level) than sampling optimization techniques in the state of the art optimized for each individual substrate, thus allowing use of a single set of characterization samples for multiple substrates. © 1992-2012 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.