Angle resolved XRF (AR-XRF) is an analytical technique in which the sample is analyzed at different angles of detection or irradiation. The change in the geometry affects the intensity of the elemental characteristic emission from the sample, which depends on the in-depth distribution of analyte. In this paper, for the first time, we apply AR-XRF to gilding samples that mime real cultural heritage ones. The samples analysed, also investigated with scanning electron microscopy, present small lateral inhomogeneities and a rough surface. Moreover, we illustrate how to analyze AR-XRF data, from the collection of XRF spectra to the creation of AR-XRF profiles and the fitting of data using Sherman's equation. Using AR-XRF combined with the fundamental parameters method we calculate the massive thickness of laboratory made layered samples.

Orsilli, J., Migliori, A., Padilla-Alvarez, R., Martini, M., Galli, A. (2023). AR-XRF measurements and data treatment for the evaluation of gildings samples in the Cultural Heritage. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 38(1), 174-185 [10.1039/D2JA00227B].

AR-XRF measurements and data treatment for the evaluation of gildings samples in the Cultural Heritage

Orsilli, Jacopo
Primo
;
Martini, Marco;Galli, Anna
Ultimo
2023

Abstract

Angle resolved XRF (AR-XRF) is an analytical technique in which the sample is analyzed at different angles of detection or irradiation. The change in the geometry affects the intensity of the elemental characteristic emission from the sample, which depends on the in-depth distribution of analyte. In this paper, for the first time, we apply AR-XRF to gilding samples that mime real cultural heritage ones. The samples analysed, also investigated with scanning electron microscopy, present small lateral inhomogeneities and a rough surface. Moreover, we illustrate how to analyze AR-XRF data, from the collection of XRF spectra to the creation of AR-XRF profiles and the fitting of data using Sherman's equation. Using AR-XRF combined with the fundamental parameters method we calculate the massive thickness of laboratory made layered samples.
Articolo in rivista - Articolo scientifico
AR-XRF, Ceramics, Cultural Heritage, XRF, Layer, X-Ray Fluorescence
English
2023
174
185
12
Orsilli, J., Migliori, A., Padilla-Alvarez, R., Martini, M., Galli, A. (2023). AR-XRF measurements and data treatment for the evaluation of gildings samples in the Cultural Heritage. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 38(1), 174-185 [10.1039/D2JA00227B].
File in questo prodotto:
File Dimensione Formato  
Orsilli-2023-J Anal At Spectrom-VoR.pdf

Solo gestori archivio

Descrizione: Article
Tipologia di allegato: Publisher’s Version (Version of Record, VoR)
Licenza: Tutti i diritti riservati
Dimensione 384.43 kB
Formato Adobe PDF
384.43 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/396135
Citazioni
  • Scopus 0
  • ???jsp.display-item.citation.isi??? 0
Social impact