Phase contrast imaging is a technique widely used in synchrotron facilities for nondestructive analysis. Such technique can also be implemented through microfocus x-ray tube systems. Recently, a relatively new type of compact, quasimonochromatic x-ray sources based on Compton backscattering has been proposed for phase contrast imaging applications. In order to plan a phase contrast imaging system setup, to evaluate the system performance and to choose the experimental parameters that optimize the image quality, it is important to have reliable software for phase contrast imaging simulation. Several software tools have been developed and tested against experimental measurements at synchrotron facilities devoted to phase contrast imaging. However, many approximations that are valid in such conditions (e.g., large source-object distance, small transverse size of the object, plane wave approximation, monochromatic beam, and Gaussian-shaped source focal spot) are not generally suitable for x-ray tubes and other compact systems. In this work we describe a general method for the simulation of phase contrast imaging using polychromatic sources based on a spherical wave description of the beam and on a double-Gaussian model of the source focal spot, we discuss the validity of some possible approximations, and we test the simulations against experimental measurements using a microfocus x-ray tube on three types of polymers (nylon, poly-ethylene-terephthalate, and poly-methyl-methacrylate) at varying source-object distance. It will be shown that, as long as all experimental conditions are described accurately in the simulations, the described method yields results that are in good agreement with experimental measurements.

Golosio, B., Delogu, P., Zanette, I., Carpinelli, M., Masala, G., Oliva, P., et al. (2008). Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances. JOURNAL OF APPLIED PHYSICS, 104(9) [10.1063/1.3006130].

Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances

CARPINELLI, Massimo;
2008

Abstract

Phase contrast imaging is a technique widely used in synchrotron facilities for nondestructive analysis. Such technique can also be implemented through microfocus x-ray tube systems. Recently, a relatively new type of compact, quasimonochromatic x-ray sources based on Compton backscattering has been proposed for phase contrast imaging applications. In order to plan a phase contrast imaging system setup, to evaluate the system performance and to choose the experimental parameters that optimize the image quality, it is important to have reliable software for phase contrast imaging simulation. Several software tools have been developed and tested against experimental measurements at synchrotron facilities devoted to phase contrast imaging. However, many approximations that are valid in such conditions (e.g., large source-object distance, small transverse size of the object, plane wave approximation, monochromatic beam, and Gaussian-shaped source focal spot) are not generally suitable for x-ray tubes and other compact systems. In this work we describe a general method for the simulation of phase contrast imaging using polychromatic sources based on a spherical wave description of the beam and on a double-Gaussian model of the source focal spot, we discuss the validity of some possible approximations, and we test the simulations against experimental measurements using a microfocus x-ray tube on three types of polymers (nylon, poly-ethylene-terephthalate, and poly-methyl-methacrylate) at varying source-object distance. It will be shown that, as long as all experimental conditions are described accurately in the simulations, the described method yields results that are in good agreement with experimental measurements.
Articolo in rivista - Articolo scientifico
ABS resins; Computer software; Electron tubes; Ethylene; Experiments; Gaussian beams; Image quality; Image resolution; Nylon polymers; Optoelectronic devices; Powders; Radiography; Synchrotrons; Trellis codes; Tubes (components); Compact systems; Compton backscatterings; Experimental conditions; Experimental measurements; Experimental parameters; Focal spots; Gaussian; Gaussian models; General methods; Monochromatic beams; Nondestructive analyses; Object distances; Phase contrasts; Plane waves; Polychromatic sources; Quasimonochromatic X-rays; Software tools; Spherical waves; System performances; System setups; Transverse sizes; Tube systems; X ray tubes;
English
Golosio, B., Delogu, P., Zanette, I., Carpinelli, M., Masala, G., Oliva, P., et al. (2008). Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances. JOURNAL OF APPLIED PHYSICS, 104(9) [10.1063/1.3006130].
Golosio, B; Delogu, P; Zanette, I; Carpinelli, M; Masala, G; Oliva, P; Stefanini, A; Stumbo, S
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/389598
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