We have developed a set-up to perform measurements of S-parameters on devices operated at low temperature, using a Vector Network Analyzer in combination with a cryogenic chamber. High accuracy in the characterization of the devices is obtained using a set of TRL calibration standards operated at the same cryogenic temperature of the DUT. Measurements have been performed on Front-End-Modules of mm-wave receivers including cryogenic LNA developed within our collaboration.
Zannoni, M., Bau', A., Passerini, A., Tartari, A., Gervasi, M., Valenziano, L. (2012). A cryogenic set-up for accurate measurements of S-parameters. In W.S. Holland, J. Zmuidzinas (a cura di), Millimeter, Submillimeter and Far-Infrared Detectors and Instrumentation For Astronomy VI. SPIE--the International Society for Optical Engineering [10.1117/12.925995].
A cryogenic set-up for accurate measurements of S-parameters
ZANNONI, MARIO;BAU', ALESSANDRO;PASSERINI, ANDREA;GERVASI, MASSIMO;
2012
Abstract
We have developed a set-up to perform measurements of S-parameters on devices operated at low temperature, using a Vector Network Analyzer in combination with a cryogenic chamber. High accuracy in the characterization of the devices is obtained using a set of TRL calibration standards operated at the same cryogenic temperature of the DUT. Measurements have been performed on Front-End-Modules of mm-wave receivers including cryogenic LNA developed within our collaboration.
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