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Scotti, R., Morazzoni, F., Di Nola, P. (1993). Point defects in semiconductor oxides studied by electron paramagnatic resonance. In F. Morazzoni (a cura di), From molecular materials to solids. Applications of nuclear magnetic and electron paramagnetic resonance spectroscopies (pp. 103-114). Polo Editoriale Chimico.

Point defects in semiconductor oxides studied by electron paramagnatic resonance

SCOTTI, ROBERTO;MORAZZONI, FRANCA;
1993
Capitolo o saggio
EPR, point defects, semiconductor, sensing
English
From molecular materials to solids. Applications of nuclear magnetic and electron paramagnetic resonance spectroscopies
Morazzoni, F
1993
88-86162-05-7
103
114
Scotti, R., Morazzoni, F., Di Nola, P. (1993). Point defects in semiconductor oxides studied by electron paramagnatic resonance. In F. Morazzoni (a cura di), From molecular materials to solids. Applications of nuclear magnetic and electron paramagnetic resonance spectroscopies (pp. 103-114). Polo Editoriale Chimico.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/38254
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