An experimental investigation about the thermoelectric properties of heavily doped p ad n-type nanocrystalline silicon nanowires (NWs) is described. The NWs are produced with low cost CMOS compatible processes, highly customizable in terms of cross-section and placement, which enables the fabrication of both stacked NWs in nearly vertical arrays within nanostructured templates built with SiO 2 /Si 3 N 4 thin films and individual, freestanding NWs suited for thermal conductivity measurements. The cross-section dimensions of the investigated NWs range between 30 and 120 nm in size and up to about 2 cm in length. The structure of the NWs, as shown by SEM/TEM observations, is nanocrystalline with average size of the nanocrystals in one dimension that is comparable with the nanowire diameter. On the NWs, Seebeck coefficient, electrical resistivity and thermal conductivity have been measured, yielding thermoelectric figure of merit (ZT) values of 0.2 at 300 K for the best case.

Suriano, F., Ferri, M., Solmi, S., Belsito, L., Roncaglia, A., Romano, E., et al. (2012). Thermoelectric Properties of p and n-type Nanocrystalline Silicon Nanowires with High Doping Levels. In MRS Proceedings (pp.mrsf11-1408-bb11-04) [10.1557/opl.2012.37].

Thermoelectric Properties of p and n-type Nanocrystalline Silicon Nanowires with High Doping Levels

NARDUCCI, DARIO;
2012

Abstract

An experimental investigation about the thermoelectric properties of heavily doped p ad n-type nanocrystalline silicon nanowires (NWs) is described. The NWs are produced with low cost CMOS compatible processes, highly customizable in terms of cross-section and placement, which enables the fabrication of both stacked NWs in nearly vertical arrays within nanostructured templates built with SiO 2 /Si 3 N 4 thin films and individual, freestanding NWs suited for thermal conductivity measurements. The cross-section dimensions of the investigated NWs range between 30 and 120 nm in size and up to about 2 cm in length. The structure of the NWs, as shown by SEM/TEM observations, is nanocrystalline with average size of the nanocrystals in one dimension that is comparable with the nanowire diameter. On the NWs, Seebeck coefficient, electrical resistivity and thermal conductivity have been measured, yielding thermoelectric figure of merit (ZT) values of 0.2 at 300 K for the best case.
paper
Thermoelectricity; Nanowires;
English
2011 MRS Fall Meeting
2011
MRS Proceedings
9781605113852
2012
1408
mrsf11-1408-bb11-04
none
Suriano, F., Ferri, M., Solmi, S., Belsito, L., Roncaglia, A., Romano, E., et al. (2012). Thermoelectric Properties of p and n-type Nanocrystalline Silicon Nanowires with High Doping Levels. In MRS Proceedings (pp.mrsf11-1408-bb11-04) [10.1557/opl.2012.37].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/37830
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