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A 9b charge-sharing SAR ADC is presented that suppresses the comparator thermal noise through a redundant search algorithm and a noise-programmable comparator. A time-interleaved bootstrapped S/H enhances sampling speed and linearity guaranteeing 32MHz effective resolution bandwidth. The prototype in 90nm digital CMOS achieves 8.56 ENOB (53.3dB SNDR) at 40MS/s and consumes 820μW from a 1V supply, resulting in an FOM of 54fJ/conversion-step. ©2008 IEEE.

Giannini, V., Nuzzo, P., Chironi, V., Baschirotto, A., Plas, G., Craninckx, J. (2008). An 820µW 9b 40MS/s Noise-Tolerant Dynamic-SAR ADC in 90nm Digital CMOS. In Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International (pp.238-610) [10.1109/ISSCC.2008.4523145].

An 820µW 9b 40MS/s Noise-Tolerant Dynamic-SAR ADC in 90nm Digital CMOS

BASCHIROTTO, ANDREA;
2008

Abstract

A 9b charge-sharing SAR ADC is presented that suppresses the comparator thermal noise through a redundant search algorithm and a noise-programmable comparator. A time-interleaved bootstrapped S/H enhances sampling speed and linearity guaranteeing 32MHz effective resolution bandwidth. The prototype in 90nm digital CMOS achieves 8.56 ENOB (53.3dB SNDR) at 40MS/s and consumes 820μW from a 1V supply, resulting in an FOM of 54fJ/conversion-step. ©2008 IEEE.
paper
ENOB reductions; SAR architectures; analog/mixed-signal design; battery-powered devices; comparator thermal noise; digital CMOS; dynamic regenerative latches; noise-tolerant dynamic-SAR ADC; power consumption; random noise; supply voltages; CMOS integrated circuits; analogue-digital conversion; comparators (circuits); flip-flops; mixed analogue-digital integrated circuits; thermal noise
English
ESSCIRC
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
2008
238
610
none
Giannini, V., Nuzzo, P., Chironi, V., Baschirotto, A., Plas, G., Craninckx, J. (2008). An 820µW 9b 40MS/s Noise-Tolerant Dynamic-SAR ADC in 90nm Digital CMOS. In Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International (pp.238-610) [10.1109/ISSCC.2008.4523145].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/36616
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