Reliable measurements of Sun Induced Fluorescence (SIF) require a good instrument characterization as well as a complex processing chain. In this paper, we summarize the state of the art SIF retrieval methods and measurements platforms for field phenotyping. Furthermore, we use HyScreen, hyperspectral-imaging system for top of canopy measurements of SIF, as an example of the instrument requirements, data process, and data validation needed to obtain reliable measurements of SIF.

Cendrero-Mateo, M., Bennertz, S., Burkart, A., Julitta, T., Cogliati, S., Scharr, H., et al. (2018). Sun induced fluorescence calibration and validation for field phenotyping. In IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium (pp.8248-8251). Institute of Electrical and Electronics Engineers Inc. [10.1109/IGARSS.2018.8519174].

Sun induced fluorescence calibration and validation for field phenotyping

Julitta T.;Cogliati S.;
2018

Abstract

Reliable measurements of Sun Induced Fluorescence (SIF) require a good instrument characterization as well as a complex processing chain. In this paper, we summarize the state of the art SIF retrieval methods and measurements platforms for field phenotyping. Furthermore, we use HyScreen, hyperspectral-imaging system for top of canopy measurements of SIF, as an example of the instrument requirements, data process, and data validation needed to obtain reliable measurements of SIF.
paper
And field spectrometers; Field phenotyping; Hyperspectral measurements; Retrievals method; Sun Induced fluorescence
English
38th Annual IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2018
2018
IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium
978-1-5386-7150-4
2018
2018-
8248
8251
8519174
none
Cendrero-Mateo, M., Bennertz, S., Burkart, A., Julitta, T., Cogliati, S., Scharr, H., et al. (2018). Sun induced fluorescence calibration and validation for field phenotyping. In IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium (pp.8248-8251). Institute of Electrical and Electronics Engineers Inc. [10.1109/IGARSS.2018.8519174].
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10281/355400
Citazioni
  • Scopus 4
  • ???jsp.display-item.citation.isi??? 3
Social impact