Improved sensitivity at synchrotrons using edge illumination X-ray phase-contrast imaging

The application of the X-ray phase-contrast 'edge illumination' principle to the highly coherent beams available at synchrotron radiation facilities is presented here. We show that, in this configuration, the technique allows achieving unprecedented angular sensitivity, of the order of few nanoradians. The results are obtained at beamlines of two different synchrotron radiation facilities, using various experimental conditions. In particular, different detectors and X-ray energies (12 keV and 85 keV) were employed, proving the flexibility of the method and the broad range of conditions over which it can be applied. Furthermore, the quantitative separation of absorption and refraction information, and the application of the edge illumination principle in combination with computed tomography, are also demonstrated. Thanks to its extremely high phase sensitivity and its flexible applicability, this technique will both improve the image quality achievable with X-ray phase-contrast imaging and allow tackling areas of application which remain unexplored until now.