A silicon strip detector for the SYRMEP (SYnchrotron Radiation for MEdical Physics) experiment has been designed and realised. The main features of this detector are AC-coupling through integrated coupling capacitors, DC bias of the strips by means of a gated punch-through structure, bulk contact on the junction side through a forward-biased p+ implant, thinned entrance window for the incoming radiation (in an "edge-on" geometry) and integrated fan-in on active silicon. Results of laboratory tests of the detector parameters, allowing a thorough evaluation of the technological solutions employed, are presented.
Arfelli, F., Bonvicini, V., Bravin, A., Burger, P., Cantatore, G., Castelli, E., et al. (1997). Design and evaluation of AC-coupled, FOXFET-biased, ''edge-on'' silicon strip detectors for X-ray imaging. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, 385(2), 311-320 [10.1016/S0168-9002(96)01076-5].
Design and evaluation of AC-coupled, FOXFET-biased, ''edge-on'' silicon strip detectors for X-ray imaging
Bravin AMembro del Collaboration Group
;
1997
Abstract
A silicon strip detector for the SYRMEP (SYnchrotron Radiation for MEdical Physics) experiment has been designed and realised. The main features of this detector are AC-coupling through integrated coupling capacitors, DC bias of the strips by means of a gated punch-through structure, bulk contact on the junction side through a forward-biased p+ implant, thinned entrance window for the incoming radiation (in an "edge-on" geometry) and integrated fan-in on active silicon. Results of laboratory tests of the detector parameters, allowing a thorough evaluation of the technological solutions employed, are presented.
| File | Dimensione | Formato | |
|---|---|---|---|
|
Arfelli_NIMA_1997_bis.pdf
Solo gestori archivio
Tipologia di allegato:
Publisher’s Version (Version of Record, VoR)
Dimensione
803.06 kB
Formato
Adobe PDF
|
803.06 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
