Edge illumination X-ray phase-contrast imaging: Nanoradian sensitivity at synchrotrons and translation to conventional sources

Edge illumination is an X-ray phase-contrast imaging technique that can be efficiently applied to both synchrotron radiation and laboratory sources. Its implementation with these two types of setups is here described, and a recently developed method to perform quantitative retrieval of the object attenuation and refraction properties is presented. We report results obtained at two synchrotron radiation facilities and with one of the setups installed in our laboratories at University College London, which show that very high angular sensitivities can be obtained with this technique. The effect of different experimental parameters on the achievable sensitivity is also analyzed. The obtained results will be a useful guide for the design and optimization of future experimental layouts.